Shoji Ozoe

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Nukata-gun, JP

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Patents Grantslast 30 patents

Information Patent Grant
Dynamic quantity sensor
- Patent number 9,835,507
- Issue date Dec 5, 2017
- Denso Corporation
- Takahiro Kawano
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device including a plurality of chips and method of m...
- Patent number 8,018,008
- Issue date Sep 13, 2011
- Denso Corporation
- Shoji Ozoe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus having temperature sensing diode
- Patent number 7,800,195
- Issue date Sep 21, 2010
- Denso Corporation
- Shoji Ozoe
- G01 - MEASURING TESTING
Information Patent Grant
Vertical type semiconductor device and method for manufacturing the...
- Patent number 7,420,246
- Issue date Sep 2, 2008
- Denso Corporation
- Shoji Ozoe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for manufacturing semiconductor dynamic quantity sensor
- Patent number 6,287,885
- Issue date Sep 11, 2001
- Denso Corporation
- Hiroshi Muto
- B81 - MICRO-STRUCTURAL TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DYNAMIC QUANTITY SENSOR
- Publication number 20160187215
- Publication date Jun 30, 2016
- Denso Corporation
- Takahiro KAWANO
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device including a plurality of chips and method of m...
- Publication number 20090278167
- Publication date Nov 12, 2009
- DESNO CORPORATION
- Shoji Ozoe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor apparatus having temperature sensing diode
- Publication number 20080203389
- Publication date Aug 28, 2008
- DENSO CORPRORATION
- Shoji Ozoe
- G01 - MEASURING TESTING
Information Patent Application
Vertical type semiconductor device and method for manufacturing the...
- Publication number 20060273351
- Publication date Dec 7, 2006
- DENSO CORPORATION
- Shoji Ozoe
- H01 - BASIC ELECTRIC ELEMENTS