Shoji YOSHIDA

Person

Ibaraki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Partial discharge detection apparatus and partial discharge detecti...
- Patent number 11,644,498
- Issue date May 9, 2023
- Hitachi, Ltd.
- Kazuhisa Takami
- G01 - MEASURING TESTING
Information Patent Grant
Memory cell, nonvolatile semiconductor storage device, and method f...
- Patent number 11,011,530
- Issue date May 18, 2021
- Floadia Corporation
- Daisuke Okada
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory cell, semiconductor integrated circuit device, and method fo...
- Patent number 10,615,168
- Issue date Apr 7, 2020
- FLOADIA CORPORATION
- Shoji Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell, semiconductor integrated circuit device, and method fo...
- Patent number 10,431,589
- Issue date Oct 1, 2019
- Floadia Corporation
- Shoji Yoshida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory cell, nonvolatile semiconductor storage device, and method f...
- Patent number 10,373,967
- Issue date Aug 6, 2019
- Floadia Corporation
- Daisuke Okada
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 9,722,096
- Issue date Aug 1, 2017
- Renesas Electronics Corporation
- Yoshiyuki Kawashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 9,508,554
- Issue date Nov 29, 2016
- Renesas Electronics Corporation
- Kazuharu Yamabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Communication control equipment
- Patent number 9,485,045
- Issue date Nov 1, 2016
- Hitachi, Ltd.
- Tatsuya Maruyama
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Digital Protection control system and digital protection control ap...
- Patent number 9,118,173
- Issue date Aug 25, 2015
- Hitachi, Ltd.
- Chikashi Komatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device with suppressed crystal defects in active areas
- Patent number 8,035,169
- Issue date Oct 11, 2011
- Renesas Electronics Corporation
- Hiroshi Ishida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and a method of manufacturing the same
- Patent number 7,750,427
- Issue date Jul 6, 2010
- Renesas Technology Corp.
- Kozo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,642,514
- Issue date Jan 5, 2010
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam alignment method and charged particle beam ap...
- Patent number 7,605,381
- Issue date Oct 20, 2009
- Hitachi, Ltd.
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and a method of manufacturing the same
- Patent number 7,504,297
- Issue date Mar 17, 2009
- Renesas Technology Corp.
- Kozo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,336,535
- Issue date Feb 26, 2008
- Renesas Technology Corp.
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,329,868
- Issue date Feb 12, 2008
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection system
- Patent number 7,235,782
- Issue date Jun 26, 2007
- Hitachi, Ltd.
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,212,425
- Issue date May 1, 2007
- Renesas Technology Corp.
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam apparatus
- Patent number 7,109,485
- Issue date Sep 19, 2006
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor inspection system
- Patent number 7,026,615
- Issue date Apr 11, 2006
- Hitachi, Ltd.
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 7,002,830
- Issue date Feb 21, 2006
- Renesas Technology Corp.
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam apparatus
- Patent number 6,936,818
- Issue date Aug 30, 2005
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam alignment method and charged particle beam ap...
- Patent number 6,864,493
- Issue date Mar 8, 2005
- Hitachi, Ltd.
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,751,138
- Issue date Jun 15, 2004
- Renesas Technology Corporation
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Grant
Charged particle beam apparatus
- Patent number 6,653,633
- Issue date Nov 25, 2003
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device and method of manufacturing...
- Patent number 6,576,509
- Issue date Jun 10, 2003
- Hitachi Ltd.
- Shigeya Toyokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image-formation apparatus using charged particle beams under variou...
- Patent number 6,538,249
- Issue date Mar 25, 2003
- Hitachi, Ltd.
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,501,689
- Issue date Dec 31, 2002
- Hitachi, Ltd.
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,064,606
- Issue date May 16, 2000
- Hitachi, Ltd.
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of controlling parallel processing at an instruction level a...
- Patent number 5,894,582
- Issue date Apr 13, 1999
- Hitachi, Ltd.
- Shoji Yoshida
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMMUNICATION CONTROL APPARATUS AND COMMUNICATION CONTROL METHOD
- Publication number 20220131681
- Publication date Apr 28, 2022
- Hitachi, Ltd
- Tatsuya MARUYAMA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PARTIAL DISCHARGE DETECTION APPARATUS AND PARTIAL DISCHARGE DETECTI...
- Publication number 20210373065
- Publication date Dec 2, 2021
- Hitachi, Ltd
- Kazuhisa TAKAMI
- G01 - MEASURING TESTING
Information Patent Application
MEMORY CELL, NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND METHOD F...
- Publication number 20210257376
- Publication date Aug 19, 2021
- FLOADIA CORPORATION
- Daisuke OKADA
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CELL, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND METHOD FO...
- Publication number 20190371799
- Publication date Dec 5, 2019
- FLOADIA CORPORATION
- Shoji YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL, NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND METHOD F...
- Publication number 20190296030
- Publication date Sep 26, 2019
- FLOADIA CORPORATION
- Daisuke OKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL, NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND METHOD F...
- Publication number 20180286875
- Publication date Oct 4, 2018
- Floadia Corporation
- Daisuke OKADA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CELL, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND METHOD FO...
- Publication number 20180211965
- Publication date Jul 26, 2018
- Floadia Corporation
- Shoji YOSHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20160190145
- Publication date Jun 30, 2016
- RENESAS ELECTRONICS CORPORATION
- Keiichi MAEKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Manufacturing Semiconductor Device
- Publication number 20160099358
- Publication date Apr 7, 2016
- RENESAS ELECTRONICS CORPORATION
- Yoshiyuki KAWASHIMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Manufacturing Semiconductor Device
- Publication number 20160093499
- Publication date Mar 31, 2016
- RENESAS ELECTRONICS CORPORATION
- Kazuharu YAMABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Digital Protection Control System and Digital Protection Control Ap...
- Publication number 20140146430
- Publication date May 29, 2014
- Hitachi, Ltd
- Chikashi Komatsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
COMMUNICATION CONTROL EQUIPMENT
- Publication number 20140098706
- Publication date Apr 10, 2014
- Hitachi, Ltd
- Tatsuya MARUYAMA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
- Publication number 20100140711
- Publication date Jun 10, 2010
- Renesas Technology Corp.
- Norio ISHITSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM ALIGNMENT METHOD AND CHARGED PARTICLE BEAM AP...
- Publication number 20100006755
- Publication date Jan 14, 2010
- Mitsugo Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME
- Publication number 20090152644
- Publication date Jun 18, 2009
- RENESAS TECHNOLOGY CORP.
- Kozo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME
- Publication number 20090134467
- Publication date May 28, 2009
- RENESAS TECHNOLOGY CORP.
- Hiroshi ISHIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20080116376
- Publication date May 22, 2008
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and a method of manufacturing the same
- Publication number 20070246780
- Publication date Oct 25, 2007
- RENESAS TECHNOLOGY CORP.
- Kozo Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor inspection system
- Publication number 20070194236
- Publication date Aug 23, 2007
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20070171692
- Publication date Jul 26, 2007
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Application
Charged particle beam apparatus
- Publication number 20070023657
- Publication date Feb 1, 2007
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and a method of manufacturing the same
- Publication number 20060133146
- Publication date Jun 22, 2006
- Keiichi Maekawa
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20060018172
- Publication date Jan 26, 2006
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Application
Appliance control apparatus and electrical appliance
- Publication number 20060012489
- Publication date Jan 19, 2006
- HITACHI, LTD.
- Toshimi Yokota
- G08 - SIGNALLING
Information Patent Application
Charged particle beam apparatus
- Publication number 20050184237
- Publication date Aug 25, 2005
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Charged particle beam alignment method and charged particle beam ap...
- Publication number 20040124364
- Publication date Jul 1, 2004
- Mitsugu Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20040090838
- Publication date May 13, 2004
- Kenichi Kuroda
- G11 - INFORMATION STORAGE
Information Patent Application
Charged particle beam apparatus
- Publication number 20040069956
- Publication date Apr 15, 2004
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor inspection system
- Publication number 20030173516
- Publication date Sep 18, 2003
- Atsushi Takane
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam apparatus
- Publication number 20030136907
- Publication date Jul 24, 2003
- Hitachi, Ltd
- Atsushi Takane
- G06 - COMPUTING CALCULATING COUNTING

Shoji YOSHIDA

Person

Patents Grantslast 30 patents

Partial discharge detection apparatus and partial discharge detecti...

Memory cell, nonvolatile semiconductor storage device, and method f...

Memory cell, semiconductor integrated circuit device, and method fo...

Memory cell, semiconductor integrated circuit device, and method fo...

Memory cell, nonvolatile semiconductor storage device, and method f...

Method of manufacturing semiconductor device

Method of manufacturing semiconductor device

Communication control equipment

Digital Protection control system and digital protection control ap...

Semiconductor device with suppressed crystal defects in active areas

Semiconductor device and a method of manufacturing the same

Charged particle beam apparatus

Charged particle beam alignment method and charged particle beam ap...

Semiconductor device and a method of manufacturing the same

Semiconductor integrated circuit device

Charged particle beam apparatus

Semiconductor inspection system

Semiconductor integrated circuit device

Charged particle beam apparatus

Semiconductor inspection system

Semiconductor integrated circuit device

Charged particle beam apparatus

Charged particle beam alignment method and charged particle beam ap...

Semiconductor integrated circuit device

Charged particle beam apparatus

Semiconductor integrated circuit device and method of manufacturing...

Image-formation apparatus using charged particle beams under variou...

Semiconductor integrated circuit device

Semiconductor integrated circuit device

Method of controlling parallel processing at an instruction level a...

Patents Applicationslast 30 patents

COMMUNICATION CONTROL APPARATUS AND COMMUNICATION CONTROL METHOD

PARTIAL DISCHARGE DETECTION APPARATUS AND PARTIAL DISCHARGE DETECTI...

MEMORY CELL, NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND METHOD F...

MEMORY CELL, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND METHOD FO...

MEMORY CELL, NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND METHOD F...

MEMORY CELL, NONVOLATILE SEMICONDUCTOR STORAGE DEVICE, AND METHOD F...

MEMORY CELL, SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE, AND METHOD FO...

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

Method of Manufacturing Semiconductor Device

Method of Manufacturing Semiconductor Device

Digital Protection Control System and Digital Protection Control Ap...

COMMUNICATION CONTROL EQUIPMENT

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

CHARGED PARTICLE BEAM ALIGNMENT METHOD AND CHARGED PARTICLE BEAM AP...

SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE AND A METHOD OF MANUFACTURING THE SAME

Charged particle beam apparatus

Semiconductor device and a method of manufacturing the same

Semiconductor inspection system

Semiconductor integrated circuit device

Charged particle beam apparatus

Semiconductor device and a method of manufacturing the same

Semiconductor integrated circuit device

Appliance control apparatus and electrical appliance

Charged particle beam apparatus

Charged particle beam alignment method and charged particle beam ap...

Semiconductor integrated circuit device

Charged particle beam apparatus

Semiconductor inspection system

Charged particle beam apparatus