Shoko Kanazawa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor chip testing method and semiconductor chip testing de...
- Patent number 9,153,502
- Issue date Oct 6, 2015
- Mitsubishi Electric Corporation
- Takuya Hamaguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR CHIP TESTING METHOD AND SEMICONDUCTOR CHIP TESTING DE...
- Publication number 20130080088
- Publication date Mar 28, 2013
- MITSUBISHI ELECTRIC CORPORATION
- Takuya HAMAGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Process failure information management system
- Publication number 20030115177
- Publication date Jun 19, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Naoko Takanabe
- G06 - COMPUTING CALCULATING COUNTING