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last 30 patents
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Patent Grant
Magnetic flaw detection method, magnetic field measurement processi...
Patent number
11,835,483
Issue date
Dec 5, 2023
Yokogawa Electric Corporation
Shinya Mito
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
MAGNET HOLDING DEVICE, MAGNETIZATION DEVICE, AND MAGNETIZING METHOD
Publication number
20230317339
Publication date
Oct 5, 2023
YOKOGAWA ELECTRIC CORPORATION
Shoma TAKEDA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIZING APPARATUS AND MAGNETIZING METHOD
Publication number
20230119946
Publication date
Apr 20, 2023
YOKOGAWA ELECTRIC CORPORATION
Shoichi SHIOSAKI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MAGNETIC FLAW DETECTION METHOD, MAGNETIC FIELD MEASUREMENT PROCESSI...
Publication number
20230108846
Publication date
Apr 6, 2023
YOKOGAWA ELECTRIC CORPORATION
Shinya MITO
G01 - MEASURING TESTING