Shota SETOGUCHI

Follow

Person

Yokohama-shi, JP

People

Patents Applicationslast 30 patents

Information Patent Application
PROBER AND SEMICONDUCTOR WAFER TESTING METHOD USING THE SAME
- Publication number 20100013509
- Publication date Jan 21, 2010
- Elpida Memory, Inc.
- Shota SETOGUCHI
- G01 - MEASURING TESTING