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Shou HARAKO

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  • Aomori, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PROBE UNIT
    • Publication number 20220390489
    • Publication date Dec 8, 2022
    • Kabushiki Kaisha Nihon Micronics
    • SATOSHI NARITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRICAL CONNECTING APPARATUS
    • Publication number 20220149549
    • Publication date May 12, 2022
    • Kabushiki Kaisha Nihon Micronics
    • Shou HARAKO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT SYSTEM AND MEASUREMENT METHOD
    • Publication number 20220034714
    • Publication date Feb 3, 2022
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL PROBE, OPTICAL PROBE ARRAY, OPTICAL PROBE CARD, AND METHOD...
    • Publication number 20210364552
    • Publication date Nov 25, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEASUREMENT SYSTEM
    • Publication number 20210148835
    • Publication date May 20, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    OPTICAL PROBE, OPTICAL PROBE ARRAY, TEST SYSTEM AND TEST METHOD
    • Publication number 20210102864
    • Publication date Apr 8, 2021
    • Kabushiki Kaisha Nihon Micronics
    • Michitaka OKUTA
    • H01 - BASIC ELECTRIC ELEMENTS