TREA

Shou Tai

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  • Nishiwaki-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Contact probe and probe device
    • Patent number 7,015,710
    • Issue date Mar 21, 2006
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe device
    • Patent number 6,937,042
    • Issue date Aug 30, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe device
    • Patent number 6,919,732
    • Issue date Jul 19, 2005
    • Genesis Technology Incorporation
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe device
    • Patent number 6,917,211
    • Issue date Jul 12, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe device
    • Patent number 6,903,563
    • Issue date Jun 7, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe device
    • Patent number 6,900,647
    • Issue date May 31, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Contact probe and probe device
    • Patent number 6,710,608
    • Issue date Mar 23, 2004
    • Mitsubishi Materials Corporation
    • Hideaki Yoshida
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Contact probe and probe device
    • Publication number 20050007130
    • Publication date Jan 13, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe and probe device
    • Publication number 20050001642
    • Publication date Jan 6, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe and probe device
    • Publication number 20050001641
    • Publication date Jan 6, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe and probe device
    • Publication number 20050001643
    • Publication date Jan 6, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe and probe device
    • Publication number 20050001644
    • Publication date Jan 6, 2005
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe and probe device
    • Publication number 20040160236
    • Publication date Aug 19, 2004
    • Genesis Technology Incorporated
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Contact probe and probe device
    • Publication number 20020186030
    • Publication date Dec 12, 2002
    • MITSUBISHI MATERIALS CORPORATION
    • Hideaki Yoshida
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTACT PROBE AND PROBE DEVICE
    • Publication number 20010019276
    • Publication date Sep 6, 2001
    • HIDEAKI YOSHIDA
    • G01 - MEASURING TESTING