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Shouichi Imai
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Kanagawa, JP
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last 30 patents
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Patent Grant
Method of making contact probe
Patent number
9,134,346
Issue date
Sep 15, 2015
National Institute of Advanced Industrial Science and Technology
Masahiro Aoyagi
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
METHOD OF MAKING CONTACT PROBE
Publication number
20110247209
Publication date
Oct 13, 2011
NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY
Masahiro Aoyagi
G01 - MEASURING TESTING
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Patent Application
CONTACT PROVE AND METHOD OF MAKING THE SAME
Publication number
20090224781
Publication date
Sep 10, 2009
SHINWA FRONTECH CORP.
Masahiro Aoyagi
G01 - MEASURING TESTING