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Shozaburo Tsuji

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Patents Grantslast 30 patents

  • Information Patent Grant

    Measurement apparatus and bearing
    • Patent number 10,907,948
    • Issue date Feb 2, 2021
    • Mitutoyo Corporation
    • Shuji Hayashida
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Induction type position measuring apparatus
    • Patent number 9,568,300
    • Issue date Feb 14, 2017
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Linear encoder
    • Patent number 9,506,778
    • Issue date Nov 29, 2016
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer
    • Patent number 9,372,059
    • Issue date Jun 21, 2016
    • Mitutoyo Corporation
    • Yoshiro Asano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer
    • Patent number D740143
    • Issue date Oct 6, 2015
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number D729659
    • Issue date May 19, 2015
    • Mitutoyo Corporation
    • Yoshiro Asano
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number 9,027,255
    • Issue date May 12, 2015
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inductive detection encoder and digital micrometer
    • Patent number 8,878,523
    • Issue date Nov 4, 2014
    • Mitutoyo Corporation
    • Hirokazu Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Displacement measuring instrument
    • Patent number 8,413,348
    • Issue date Apr 9, 2013
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Heat insulating cover and micrometer
    • Patent number 8,245,413
    • Issue date Aug 21, 2012
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Heat-insulating cover for micrometer
    • Patent number D653134
    • Issue date Jan 31, 2012
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 7,877,894
    • Issue date Feb 1, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer
    • Patent number D611371
    • Issue date Mar 9, 2010
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Absolute position measuring apparatus
    • Patent number 7,584,551
    • Issue date Sep 8, 2009
    • Mitutoyo Corporation
    • Masamichi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 7,552,544
    • Issue date Jun 30, 2009
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 7,467,480
    • Issue date Dec 23, 2008
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Absolute rotary encoder and micrometer
    • Patent number 7,385,389
    • Issue date Jun 10, 2008
    • Mitutoyo Corporation
    • Tomohiro Tahara
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement instrument
    • Patent number 7,321,231
    • Issue date Jan 22, 2008
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Inductive displacement detector and micrometer
    • Patent number 7,081,746
    • Issue date Jul 25, 2006
    • Mitutoyo Corporation
    • Toshihiko Aoki
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    MEASUREMENT APPARATUS AND BEARING
    • Publication number 20200217363
    • Publication date Jul 9, 2020
    • Mitutoyo Corporation
    • Shuji HAYASHIDA
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Application

    LINEAR ENCODER
    • Publication number 20150219475
    • Publication date Aug 6, 2015
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    INDUCTION TYPE POSITION MEASURING APPARATUS
    • Publication number 20150219434
    • Publication date Aug 6, 2015
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    MICROMETER
    • Publication number 20150059196
    • Publication date Mar 5, 2015
    • MITUTOYO CORPORATION
    • Yoshiro ASANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MICROMETER
    • Publication number 20130276319
    • Publication date Oct 24, 2013
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    INDUCTIVE DETECTION ENCODER AND DIGITAL MICROMETER
    • Publication number 20130069637
    • Publication date Mar 21, 2013
    • Mitutoyo Corporation
    • Hirokazu Kobayashi
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLACEMENT MEASURING INSTRUMENT
    • Publication number 20110252659
    • Publication date Oct 20, 2011
    • Mitutoyo Corporation
    • Shozaburo Tsuji
    • G01 - MEASURING TESTING
  • Information Patent Application

    HEAT INSULATING COVER AND MICROMETER
    • Publication number 20110061256
    • Publication date Mar 17, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    DIGITAL DISPLACEMENT MEASURING INSTRUMENT
    • Publication number 20100024237
    • Publication date Feb 4, 2010
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Absolute position measuring apparatus
    • Publication number 20090031578
    • Publication date Feb 5, 2009
    • Mitutoyo Corporation
    • Masamichi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Digital displacement measuring instrument
    • Publication number 20080250665
    • Publication date Oct 16, 2008
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Digital displacement measuring instrument
    • Publication number 20080010850
    • Publication date Jan 17, 2008
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measurement instrument
    • Publication number 20070018658
    • Publication date Jan 25, 2007
    • Mitutoyo Corporation
    • Shuuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Application

    Absolute rotary encoder and micrometer
    • Publication number 20060250128
    • Publication date Nov 9, 2006
    • Mitutoyo Corporation
    • Tomohiro Tahara
    • G01 - MEASURING TESTING
  • Information Patent Application

    Inductive displacement detector and micrometer
    • Publication number 20050122197
    • Publication date Jun 9, 2005
    • Mitutoyo Corporation
    • Toshihiko Aoki
    • G01 - MEASURING TESTING