Shridhar C. Nath

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Gaithersburg, MD, US

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Patents Grantslast 30 patents

Information Patent Grant
Radially focused eddy current sensor for detection of longitudinal...
- Patent number 5,942,894
- Issue date Aug 24, 1999
- The United States of America as represented by the administrator of the Natio...
- Russell A. Wincheski
- G01 - MEASURING TESTING
Information Patent Grant
Thickness gauging of single-layer conductive materials with two-poi...
- Patent number 5,847,562
- Issue date Dec 8, 1998
- The United States of America as represented by the administrator of the Natio...
- James P. Fulton
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current method for fatigue testing
- Patent number 5,698,977
- Issue date Dec 16, 1997
- The United States of America as represented by the administrator of the Natio...
- John W. Simpson
- G01 - MEASURING TESTING
Information Patent Grant
Rotating flux-focusing eddy current probe for flaw detection
- Patent number 5,648,721
- Issue date Jul 15, 1997
- The United States of America as represented by the administrator of the Natio...
- Russell A. Wincheski
- G01 - MEASURING TESTING
Information Patent Grant
Flux focusing eddy current probe
- Patent number 5,617,024
- Issue date Apr 1, 1997
- The United States of America as represented by the United States National Aer...
- John W. Simpson
- G01 - MEASURING TESTING