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Shu Hirata
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Kawasaki, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Encoder
Patent number
11,774,270
Issue date
Oct 3, 2023
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration in...
Patent number
10,302,466
Issue date
May 28, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration ou...
Patent number
10,295,378
Issue date
May 21, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration in...
Patent number
10,295,648
Issue date
May 21, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Contamination and defect resistant optical encoder configuration fo...
Patent number
10,168,189
Issue date
Jan 1, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Grant
Scale for an absolute position detection type photoelectric encoder...
Patent number
10,119,844
Issue date
Nov 6, 2018
Mitutoyo Corporation
Shu Hirata
G01 - MEASURING TESTING
Information
Patent Grant
Photoelectric encoder having a two-level code pattern using three o...
Patent number
10,041,815
Issue date
Aug 7, 2018
Mitutoyo Corporation
Shu Hirata
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ENCODER
Publication number
20230059800
Publication date
Feb 23, 2023
Mitutoyo Corporation
Norman Laman
G01 - MEASURING TESTING
Information
Patent Application
FRONT-END CIRCUIT AND ENCODER
Publication number
20220311399
Publication date
Sep 29, 2022
Mitutoyo Corporation
Shu Hirata
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
FRONT-END CIRCUIT AND ENCODER
Publication number
20220307866
Publication date
Sep 29, 2022
Mitutoyo Corporation
Shu Hirata
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190003858
Publication date
Jan 3, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190003859
Publication date
Jan 3, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190004142
Publication date
Jan 3, 2019
Mitutoyo Corporation
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
CONTAMINATION AND DEFECT RESISTANT OPTICAL ENCODER CONFIGURATION FO...
Publication number
20190003860
Publication date
Jan 3, 2019
MITUTOYO CORPORATION
Joseph Daniel Tobiason
G01 - MEASURING TESTING
Information
Patent Application
PHOTOELECTRIC ENCODER
Publication number
20170276522
Publication date
Sep 28, 2017
Mitutoyo Corporation
Shu Hirata
G01 - MEASURING TESTING
Information
Patent Application
ABSOLUTE POSITION DETECTION TYPE PHOTOELECTRIC ENCODER
Publication number
20170074687
Publication date
Mar 16, 2017
Mitutoyo Corporation
Shu Hirata
G01 - MEASURING TESTING