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Shu-Kan Lin
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Hsinchu Hsiang, TW
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Patents Grants
last 30 patents
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Patent Grant
Cantilever-type probe card for high frequency application
Patent number
7,595,651
Issue date
Sep 29, 2009
MPI Corporation
Wei-Cheng Ku
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
Cantilever-type probe card for high frequency application
Publication number
20080191726
Publication date
Aug 14, 2008
MJC PROBE INCORPORATION
Wei-Cheng Ku
G01 - MEASURING TESTING