Shu-Liang NING

Person

Hefei, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Base die with error checking and correction , memory system, and se...
- Patent number 12,164,374
- Issue date Dec 10, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Chip and chip test system
- Patent number 12,092,685
- Issue date Sep 17, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Base die, memory system, and semiconductor structure
- Patent number 11,983,416
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for adjusting memory, and semiconductor device
- Patent number 11,984,190
- Issue date May 14, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Base die, memory system, and semiconductor structure
- Patent number 11,978,525
- Issue date May 7, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for adjusting memory, and semiconductor device
- Patent number 11,928,357
- Issue date Mar 12, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory chip and memory system
- Patent number 11,915,784
- Issue date Feb 27, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory
- Patent number 11,914,417
- Issue date Feb 27, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system
- Patent number 11,893,282
- Issue date Feb 6, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for adjusting memory, and semiconductor device
- Patent number 11,886,721
- Issue date Jan 30, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory for reducing cost and power consumption
- Patent number 11,886,357
- Issue date Jan 30, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reading and writing method of memory device and memory device
- Patent number 11,862,229
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Memory chip and memory system
- Patent number 11,862,290
- Issue date Jan 2, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device, testing method and using method thereof, and memory...
- Patent number 11,854,640
- Issue date Dec 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory
- Patent number 11,854,662
- Issue date Dec 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Base die, memory system, and semiconductor structure
- Patent number 11,853,591
- Issue date Dec 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Base die, memory system, and semiconductor structure
- Patent number 11,847,344
- Issue date Dec 19, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for regulating memory, and semiconductor device
- Patent number 11,735,233
- Issue date Aug 22, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory device and test circuit for the same
- Patent number 11,710,530
- Issue date Jul 25, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for adjusting memory, and semiconductor device
- Patent number 11,705,165
- Issue date Jul 18, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Base die, memory system, and semiconductor structure
- Patent number 11,645,151
- Issue date May 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Wafer stacking method and wafer stacking structure
- Patent number 11,545,468
- Issue date Jan 3, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ling-Yi Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Chip test method, apparatus, device, and system
- Patent number 11,536,770
- Issue date Dec 27, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G01 - MEASURING TESTING
Information Patent Grant
Power supply system and semiconductor package assembly
- Patent number 11,488,653
- Issue date Nov 1, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE
Information Patent Grant
Power supply system and semiconductor package assembly
- Patent number 11,482,272
- Issue date Oct 25, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer stacking method and wafer stacking structure
- Patent number 11,348,873
- Issue date May 31, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ling-Yi Chuang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test method and test system
- Patent number 11,320,484
- Issue date May 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G01 - MEASURING TESTING
Information Patent Grant
Memory circuit device and a method for testing the same
- Patent number 11,205,499
- Issue date Dec 21, 2021
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Shu-Liang Ning
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CHIP PACKAGE STRUCTURE AND STORAGE SYSTEM
- Publication number 20230223326
- Publication date Jul 13, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- SHU-LIANG NING
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY SYSTEM
- Publication number 20230176784
- Publication date Jun 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY CHIP AND MEMORY SYSTEM
- Publication number 20230178123
- Publication date Jun 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CHIP AND MEMORY SYSTEM
- Publication number 20230178124
- Publication date Jun 8, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE
- Publication number 20230139658
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- SHU-LIANG NING
- G11 - INFORMATION STORAGE
Information Patent Application
BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE
- Publication number 20230134961
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE
- Publication number 20230136772
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE
- Publication number 20230135245
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE
- Publication number 20230136990
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE
- Publication number 20230137700
- Publication date May 4, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY
- Publication number 20230126683
- Publication date Apr 27, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR ADJUSTING MEMORY, AND SEMICONDUCTOR DEVICE
- Publication number 20220137872
- Publication date May 5, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STORAGE SYSTEM
- Publication number 20220129397
- Publication date Apr 28, 2022
- CHANGXIN MEMORY TECHNOLGIES, INC.
- SHU-LIANG NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE, TESTING METHOD AND USING METHOD THEREOF, AND MEMORY...
- Publication number 20220084619
- Publication date Mar 17, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
READING AND WRITING METHOD OF MEMORY DEVICE AND MEMORY DEVICE
- Publication number 20220076730
- Publication date Mar 10, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR ADJUSTING MEMORY, AND SEMICONDUCTOR DEVICE
- Publication number 20220068321
- Publication date Mar 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND SYSTEM FOR ADJUSTING MEMORY, AND SEMICONDUCTOR DEVICE
- Publication number 20220066661
- Publication date Mar 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR REGULATING MEMORY, AND SEMICONDUCTOR DEVICE
- Publication number 20220068320
- Publication date Mar 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY
- Publication number 20220068336
- Publication date Mar 3, 2022
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY
- Publication number 20220066962
- Publication date Mar 3, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP AND CHIP TEST SYSTEM
- Publication number 20210208196
- Publication date Jul 8, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POWER SUPPLY SYSTEM AND SEMICONDUCTOR PACKAGE ASSEMBLY
- Publication number 20210210133
- Publication date Jul 8, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
POWER SUPPLY SYSTEM AND SEMICONDUCTOR PACKAGE ASSEMBLY
- Publication number 20210210134
- Publication date Jul 8, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
CHIP TEST METHOD, APPARATUS, DEVICE, AND SYSTEM
- Publication number 20210208198
- Publication date Jul 8, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G01 - MEASURING TESTING
Information Patent Application
WAFER STACKING METHOD AND WAFER STACKING STRUCTURE
- Publication number 20210202448
- Publication date Jul 1, 2021
- Changxin Memory Technologies, Inc.
- Ling-Yi CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST METHOD AND TEST SYSTEM
- Publication number 20210156914
- Publication date May 27, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM-IN-PACKAGE (SiP) ASSEMBLY
- Publication number 20210134384
- Publication date May 6, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
WAFER STACKING METHOD AND WAFER STACKING STRUCTURE
- Publication number 20210074644
- Publication date Mar 11, 2021
- Changxin Memory Technologies, Inc.
- Ling-Yi CHUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEMORY CIRCUIT DEVICE AND A METHOD FOR TESTING THE SAME
- Publication number 20210050069
- Publication date Feb 18, 2021
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE AND TEST CIRCUIT FOR THE SAME
- Publication number 20200388345
- Publication date Dec 10, 2020
- Changxin Memory Technologies, Inc.
- Shu-Liang NING
- H03 - BASIC ELECTRONIC CIRCUITRY

Shu-Liang NING

Person

Patents Grantslast 30 patents

Base die with error checking and correction , memory system, and se...

Chip and chip test system

Base die, memory system, and semiconductor structure

Method and system for adjusting memory, and semiconductor device

Base die, memory system, and semiconductor structure

Method and system for adjusting memory, and semiconductor device

Memory chip and memory system

Memory

Memory system

Method and system for adjusting memory, and semiconductor device

Memory for reducing cost and power consumption

Reading and writing method of memory device and memory device

Memory chip and memory system

Memory device, testing method and using method thereof, and memory...

Memory

Base die, memory system, and semiconductor structure

Base die, memory system, and semiconductor structure

Method and system for regulating memory, and semiconductor device

Memory device and test circuit for the same

Method and system for adjusting memory, and semiconductor device

Base die, memory system, and semiconductor structure

Wafer stacking method and wafer stacking structure

Chip test method, apparatus, device, and system

Power supply system and semiconductor package assembly

Power supply system and semiconductor package assembly

Wafer stacking method and wafer stacking structure

Test method and test system

Memory circuit device and a method for testing the same

Patents Applicationslast 30 patents

CHIP PACKAGE STRUCTURE AND STORAGE SYSTEM

MEMORY SYSTEM

MEMORY CHIP AND MEMORY SYSTEM

MEMORY CHIP AND MEMORY SYSTEM

BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE

BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE

BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE

BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE

BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE

BASE DIE, MEMORY SYSTEM, AND SEMICONDUCTOR STRUCTURE

MEMORY

METHOD AND SYSTEM FOR ADJUSTING MEMORY, AND SEMICONDUCTOR DEVICE

STORAGE SYSTEM

MEMORY DEVICE, TESTING METHOD AND USING METHOD THEREOF, AND MEMORY...

READING AND WRITING METHOD OF MEMORY DEVICE AND MEMORY DEVICE

METHOD AND SYSTEM FOR ADJUSTING MEMORY, AND SEMICONDUCTOR DEVICE

METHOD AND SYSTEM FOR ADJUSTING MEMORY, AND SEMICONDUCTOR DEVICE

METHOD AND SYSTEM FOR REGULATING MEMORY, AND SEMICONDUCTOR DEVICE

MEMORY

MEMORY

CHIP AND CHIP TEST SYSTEM

POWER SUPPLY SYSTEM AND SEMICONDUCTOR PACKAGE ASSEMBLY

POWER SUPPLY SYSTEM AND SEMICONDUCTOR PACKAGE ASSEMBLY

CHIP TEST METHOD, APPARATUS, DEVICE, AND SYSTEM

WAFER STACKING METHOD AND WAFER STACKING STRUCTURE

TEST METHOD AND TEST SYSTEM

SYSTEM-IN-PACKAGE (SiP) ASSEMBLY

WAFER STACKING METHOD AND WAFER STACKING STRUCTURE

MEMORY CIRCUIT DEVICE AND A METHOD FOR TESTING THE SAME

MEMORY DEVICE AND TEST CIRCUIT FOR THE SAME