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Shuai Li

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  • Fremont, CA, US
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Patents Grantslast 30 patents

  • Information Patent Grant

    Charged particle source
    • Patent number 11,075,053
    • Issue date Jul 27, 2021
    • ASML Netherlands B.V.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle source
    • Patent number 10,468,227
    • Issue date Nov 5, 2019
    • Hermes-Microvision, Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle source
    • Patent number 10,032,600
    • Issue date Jul 24, 2018
    • Hermes-Microvision, Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle source
    • Patent number 9,812,283
    • Issue date Nov 7, 2017
    • Hermes-Microvision, Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle source
    • Patent number 9,799,484
    • Issue date Oct 24, 2017
    • Hermes-Microvision, Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Charged particle source
    • Patent number 9,754,760
    • Issue date Sep 5, 2017
    • Hermes Microvision Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Swing objective lens
    • Patent number 9,583,306
    • Issue date Feb 28, 2017
    • Hermes Microvision Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Method and compound system for inspecting and reviewing defects
    • Patent number 9,437,395
    • Issue date Sep 6, 2016
    • Hermes Microvision Inc.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Electron beam apparatus
    • Patent number 9,048,063
    • Issue date Jun 2, 2015
    • Hermes-Microvision, Inc.
    • Weiming Ren
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

  • Information Patent Application

    CHARGED PARTICLE SOURCE
    • Publication number 20220068589
    • Publication date Mar 3, 2022
    • ASML NETHERLANDS B.V.
    • Shuai LI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    CHARGED PARTICLE SOURCE
    • Publication number 20200126753
    • Publication date Apr 23, 2020
    • ASML NETHERLANDS B.V.
    • Shuai LI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Source
    • Publication number 20190057833
    • Publication date Feb 21, 2019
    • HERMES MICROVISION, INC.
    • Shuai LI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Source
    • Publication number 20170125202
    • Publication date May 4, 2017
    • HERMES MICROVISION INC.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Source
    • Publication number 20170125203
    • Publication date May 4, 2017
    • HERMES MICROVISION INC.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Source
    • Publication number 20170125204
    • Publication date May 4, 2017
    • HERMES MICROVISION INC.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Swing Objective Lens
    • Publication number 20160172150
    • Publication date Jun 16, 2016
    • HERMES MICROVISION INC.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Method and Compound System for Inspecting and Reviewing Defects
    • Publication number 20160163502
    • Publication date Jun 9, 2016
    • HERMES MICROVISION INC.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    Charged Particle Source
    • Publication number 20160163500
    • Publication date Jun 9, 2016
    • HERMES MICROVISION INC.
    • Shuai Li
    • H01 - BASIC ELECTRIC ELEMENTS