Shuen-Cheng Lei

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Taipei County, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for predicting tolerable spacing between conductors in semic...
- Patent number 8,516,400
- Issue date Aug 20, 2013
- United Microelectronics Corp.
- Chien-Li Kuo
- G01 - MEASURING TESTING
Information Patent Grant
Method and pattern carrier for optimizing inspection recipe of defe...
- Patent number 8,487,644
- Issue date Jul 16, 2013
- United Microelectronics Corp.
- Pong-Wey Huang
- G01 - MEASURING TESTING
Information Patent Grant
Alignment mark and defect inspection method
- Patent number 7,817,265
- Issue date Oct 19, 2010
- United Microelectronics Corp.
- Ling-Chun Chou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PREDICTING TOLERABLE SPACING BETWEEN CONDUCTORS IN SEMIC...
- Publication number 20120112782
- Publication date May 10, 2012
- United Microelectronics Corp.
- Chien-Li Kuo
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND PATTERN CARRIER FOR OPTIMIZING INSPECTION RECIPE OF DEFE...
- Publication number 20120019279
- Publication date Jan 26, 2012
- United Microelectronics Corp.
- Pong-Wey Huang
- G01 - MEASURING TESTING
Information Patent Application
ALIGNMENT MARK
- Publication number 20100327451
- Publication date Dec 30, 2010
- Ling-Chun Chou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION STRUCTURE AND METHOD FOR IN-LINE MONITORING WAFER
- Publication number 20100308220
- Publication date Dec 9, 2010
- United Microlelectronics Corp
- Ling-Chun Chou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ALIGNMENT MARK AND DEFECT INSPECTION METHOD
- Publication number 20100073671
- Publication date Mar 25, 2010
- Ling-Chun Chou
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY