Shuhei HASHIBA

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Patents Grantslast 30 patents

Information Patent Grant
Mass spectrometer and mass analyzing method
- Patent number 9,184,037
- Issue date Nov 10, 2015
- Hitachi High-Technologies Corporation
- Shun Kumano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer method and mass spectrometer
- Patent number 9,076,638
- Issue date Jul 7, 2015
- Hitachi High-Technologies Corporation
- Masuyuki Sugiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and computer program products for mass spectrometry
- Patent number 8,686,352
- Issue date Apr 1, 2014
- Hitachi, Ltd.
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometry system and mass spectrometry method
- Patent number 7,626,162
- Issue date Dec 1, 2009
- Hitachi, Ltd.
- Shuhei Hashiba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETER AND MASS ANALYZING METHOD
- Publication number 20120326022
- Publication date Dec 27, 2012
- Shun KUMANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND COMPUTER PROGRAM PRODUCTS FOR MASS SPECTROMETRY
- Publication number 20120298852
- Publication date Nov 29, 2012
- Hitachi, Ltd.
- Yohei Kawaguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER METHOD AND MASS SPECTROMETER
- Publication number 20120223223
- Publication date Sep 6, 2012
- Hitachi High-Technologies Corporation
- Masuyuki SUGIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETRY SYSTEM AND MASS SPECTROMETRY METHOD
- Publication number 20080283740
- Publication date Nov 20, 2008
- Hitachi, Ltd.
- Shuhei HASHIBA
- G01 - MEASURING TESTING