Shuhei Nishida

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Specimen support and scanning probe microscope
- Patent number 9,746,494
- Issue date Aug 29, 2017
- The Foundation for the Promotion of Industrial Science
- Shuhei Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope apparatus
- Patent number 7,904,966
- Issue date Mar 8, 2011
- Japan Science and Technology Agency
- Dai Kobayashi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN SUPPORT AND SCANNING PROBE MICROSCOPE
- Publication number 20170059610
- Publication date Mar 2, 2017
- THE FOUNDATION FOR THE PROMOTION OF INDUSTRIAL SCIENCE
- SHUHEI NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE APPARATUS
- Publication number 20090261249
- Publication date Oct 22, 2009
- JAPAN SCIENCE AND TECHNOLOGY AGENCY
- Dai Kobayashi
- G01 - MEASURING TESTING