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Shuhong LIU
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Chandler, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Inline inspection of the contact between conductive traces and subs...
Patent number
9,746,428
Issue date
Aug 29, 2017
Intel Corporation
Shuhong Liu
G02 - OPTICS
Information
Patent Grant
Inline measurement of molding material thickness using terahertz re...
Patent number
9,508,610
Issue date
Nov 29, 2016
Intel Corporation
Shuhong Liu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Metrology tool for electroless copper thickness measurement for BBU...
Patent number
9,441,952
Issue date
Sep 13, 2016
Intel Corporation
Nilanjan Ghosh
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Inline inspection of the contact between conductive traces and subs...
Patent number
9,389,064
Issue date
Jul 12, 2016
Intel Corporation
Shuhong Liu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
NONDESTRUCTIVE OPTICAL DETECTION OF TRACE UNDERCUT, WIDTH AND THICK...
Publication number
20170059303
Publication date
Mar 2, 2017
Robert Alan May
G01 - MEASURING TESTING
Information
Patent Application
INLINE INSPECTION OF THE CONTACT BETWEEN CONDUCTIVE TRACES AND SUBS...
Publication number
20160245758
Publication date
Aug 25, 2016
Intel Corporation
Shuhong Liu
G01 - MEASURING TESTING
Information
Patent Application
INLINE MEASUREMENT OF MOLDING MATERIAL THICKNESS USING TERAHERTZ RE...
Publication number
20160093540
Publication date
Mar 31, 2016
Intel Corporation
Shuhong LIU
G01 - MEASURING TESTING
Information
Patent Application
INLINE INSPECTION OF THE CONTACT BETWEEN CONDUCTIVE TRACES AND SUBS...
Publication number
20150276375
Publication date
Oct 1, 2015
Shuhong Liu
G01 - MEASURING TESTING
Information
Patent Application
METROLOGY TOOL FOR ELECTROLESS COPPER THICKNESS MEASUREMENT FOR BBU...
Publication number
20150092201
Publication date
Apr 2, 2015
Nilanjan Ghosh
G01 - MEASURING TESTING