Shuichi BABA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Scanning probe microscope and sample observation method using same
- Patent number 9,417,262
- Issue date Aug 16, 2016
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,844,061
- Issue date Sep 23, 2014
- Hitachi, Ltd.
- Shuichi Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring displacement of a sample using a...
- Patent number 8,659,761
- Issue date Feb 25, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
- Patent number 8,629,985
- Issue date Jan 14, 2014
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and a measuring method using the same
- Patent number 8,353,060
- Issue date Jan 8, 2013
- Hitachi, Ltd.
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 8,342,008
- Issue date Jan 1, 2013
- Hitachi, Ltd.
- Shuichi Baba
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Displacement measurement method and apparatus thereof, stage appara...
- Patent number 8,284,406
- Issue date Oct 9, 2012
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for measuring displacement of a sample to be i...
- Patent number 8,064,066
- Issue date Nov 22, 2011
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 8,011,230
- Issue date Sep 6, 2011
- Hitachi, Ltd.
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 7,966,867
- Issue date Jun 28, 2011
- Hitachi, Ltd.
- Masahiro Watanabe
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and sample observation method using the same
- Patent number 7,716,970
- Issue date May 18, 2010
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope
- Patent number 7,631,548
- Issue date Dec 15, 2009
- Hitachi, Ltd.
- Shuichi Baba
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring displacement of a sample
- Patent number 7,612,889
- Issue date Nov 3, 2009
- Hitachi, Ltd.
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and sample observing method using this an...
- Patent number 7,562,564
- Issue date Jul 21, 2009
- Hitachi, Ltd.
- Shuichi Baba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PAINTING WORK MANAGEMENT DEVICE, PAINTING WORK MANAGEMENT PROGRAM,...
- Publication number 20240399404
- Publication date Dec 5, 2024
- Hitachi, Ltd
- Shuichi BABA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SPECTROSCOPIC MEASUREMENT DEVICE
- Publication number 20240060880
- Publication date Feb 22, 2024
- HITACHI HIGH-TECH CORPORATION
- Masahiro WATANABE
- G02 - OPTICS
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SAME
- Publication number 20150377922
- Publication date Dec 31, 2015
- Hitachi ,Ltd.
- Toshihiko NAKATA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20140298548
- Publication date Oct 2, 2014
- Shuichi BABA
- B82 - NANO-TECHNOLOGY
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20130205454
- Publication date Aug 8, 2013
- Hitachi, Ltd
- Shuichi BABA
- B82 - NANO-TECHNOLOGY
Information Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
- Publication number 20120327429
- Publication date Dec 27, 2012
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE I...
- Publication number 20120062903
- Publication date Mar 15, 2012
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
A SCANNING PROBE MICROSCOPE AND A MEASURING METHOD USING THE SAME
- Publication number 20110055982
- Publication date Mar 3, 2011
- Masahiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE
- Publication number 20100039652
- Publication date Feb 18, 2010
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Displacement Measurement Method and Apparatus Thereof, Stage Appara...
- Publication number 20090210971
- Publication date Aug 20, 2009
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20090158828
- Publication date Jun 25, 2009
- Shuichi BABA
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20080257024
- Publication date Oct 23, 2008
- Masahiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME
- Publication number 20080245139
- Publication date Oct 9, 2008
- Takafumi Morimoto
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE
- Publication number 20080223122
- Publication date Sep 18, 2008
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and sample observation method using the s...
- Publication number 20080223117
- Publication date Sep 18, 2008
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Scanning Microscope With Shape Correction Means
- Publication number 20080047334
- Publication date Feb 28, 2008
- Shuichi Baba
- G01 - MEASURING TESTING
Information Patent Application
Scanning Probe Microscope
- Publication number 20070266780
- Publication date Nov 22, 2007
- SHUICHI BABA
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for measuring displacement of a sample
- Publication number 20060215171
- Publication date Sep 28, 2006
- Toshihiko Nakata
- G01 - MEASURING TESTING
Information Patent Application
Scanning probe microscope and sample observing method using this an...
- Publication number 20060113469
- Publication date Jun 1, 2006
- Shuichi Baba
- G01 - MEASURING TESTING

Shuichi BABA

Person

Patents Grantslast 30 patents

Scanning probe microscope and sample observation method using same

Scanning probe microscope

Method and apparatus for measuring displacement of a sample using a...

Displacement measurement method and apparatus thereof, stage appara...

Scanning probe microscope and a measuring method using the same

Scanning probe microscope

Displacement measurement method and apparatus thereof, stage appara...

Method and apparatus for measuring displacement of a sample to be i...

Scanning probe microscope

Scanning probe microscope

Scanning probe microscope and sample observation method using the same

Scanning probe microscope

Method and apparatus for measuring displacement of a sample

Scanning probe microscope and sample observing method using this an...

Patents Applicationslast 30 patents

PAINTING WORK MANAGEMENT DEVICE, PAINTING WORK MANAGEMENT PROGRAM,...

SPECTROSCOPIC MEASUREMENT DEVICE

SCANNING PROBE MICROSCOPE AND SAMPLE OBSERVATION METHOD USING SAME

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE

Displacement Measurement Method and Apparatus Thereof, Stage Appara...

METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE TO BE I...

A SCANNING PROBE MICROSCOPE AND A MEASURING METHOD USING THE SAME

METHOD AND APPARATUS FOR MEASURING DISPLACEMENT OF A SAMPLE

Displacement Measurement Method and Apparatus Thereof, Stage Appara...

Scanning Probe Microscope

SCANNING PROBE MICROSCOPE

SCANNING PROBE MICROSCOPE AND MEASUREMENT METHOD OF SAME

SCANNING PROBE MICROSCOPE

Scanning probe microscope and sample observation method using the s...

Scanning Microscope With Shape Correction Means

Scanning Probe Microscope

Method and apparatus for measuring displacement of a sample

Scanning probe microscope and sample observing method using this an...