Shuichi Chikamatsu

Person

Hitachinaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Defect inspection system
- Patent number 8,804,109
- Issue date Aug 12, 2014
- Hitachi High-Technologies Corporation
- Kenji Aiko
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,345,233
- Issue date Jan 1, 2013
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system
- Patent number 8,319,960
- Issue date Nov 27, 2012
- Hitachi High-Technologies Corporation
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection device and inspection method
- Patent number 8,314,930
- Issue date Nov 20, 2012
- Hitachi High-Technologies Corporation
- Koichi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 8,228,496
- Issue date Jul 24, 2012
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting method and apparatus
- Patent number 8,134,701
- Issue date Mar 13, 2012
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,102,522
- Issue date Jan 24, 2012
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,953,567
- Issue date May 31, 2011
- Hitachi High-Technologies Corporation
- Kei Shimura
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting defects on an object
- Patent number 7,940,383
- Issue date May 10, 2011
- Hitachi, Ltd.
- Minori Noguchi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Defect inspection method and defect inspection apparatus
- Patent number 7,847,927
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 7,847,928
- Issue date Dec 7, 2010
- Hitachi High-Technologies Corporation
- Koichi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting apparatus
- Patent number 7,733,475
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection system
- Patent number 7,733,474
- Issue date Jun 8, 2010
- Hitachi High-Technologies Corporation
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,692,779
- Issue date Apr 6, 2010
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 7,672,799
- Issue date Mar 2, 2010
- Hitachi High-Technologies Corporation
- Kei Shimura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,639,350
- Issue date Dec 29, 2009
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspecting apparatus
- Patent number 7,535,561
- Issue date May 19, 2009
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,443,496
- Issue date Oct 28, 2008
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,098,055
- Issue date Aug 29, 2006
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing defects
- Patent number 7,037,735
- Issue date May 2, 2006
- Hitachi, Ltd.
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Optical apparatus for defect and particle size inspection
- Patent number 6,411,377
- Issue date Jun 25, 2002
- Hitachi, Ltd.
- Minori Noguchi
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION APPARATUS
- Publication number 20130194579
- Publication date Aug 1, 2013
- Yukihisa Mohara
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM
- Publication number 20130182100
- Publication date Jul 18, 2013
- Hitachi High-Technologies Corporation
- Kenji AIKO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20130033705
- Publication date Feb 7, 2013
- Hitachi High-Technologies Corporation
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20120140212
- Publication date Jun 7, 2012
- Hitachi High-Technologies Corporation
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD, AND DEFECT INSPECTION DEVICE
- Publication number 20110141463
- Publication date Jun 16, 2011
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20110051131
- Publication date Mar 3, 2011
- Hitachi High-Technologies Corporation
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION SYSTEM
- Publication number 20100271473
- Publication date Oct 28, 2010
- Hitachi High-Technologies Corporation
- Kenji AIKO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Defect Inspection Method and Defect Inspection Apparatus
- Publication number 20100271627
- Publication date Oct 28, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING APPARATUS
- Publication number 20100214561
- Publication date Aug 26, 2010
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20100106443
- Publication date Apr 29, 2010
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus And Method For Testing Defects
- Publication number 20100088042
- Publication date Apr 8, 2010
- Minori NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and inspection method
- Publication number 20090262339
- Publication date Oct 22, 2009
- Tadashi Suga
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTING APPARATUS
- Publication number 20090207405
- Publication date Aug 20, 2009
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS
- Publication number 20090059216
- Publication date Mar 5, 2009
- Yukihiro Shibata
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20080297779
- Publication date Dec 4, 2008
- Koichi TANIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTING DEVICE AND INSPECTING METHOD
- Publication number 20080297786
- Publication date Dec 4, 2008
- Hitachi High-Technologies Corporation
- Hideki Fukushima
- G01 - MEASURING TESTING
Information Patent Application
Defect inspection system
- Publication number 20080291436
- Publication date Nov 27, 2008
- Kenji Aiko
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Defect Inspection Method and Defect Inspection Apparatus
- Publication number 20080204736
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
Defect Inspection Apparatus and Defect Inspection Method
- Publication number 20080059094
- Publication date Mar 6, 2008
- Hitachi High-Technologies Corporation
- Kei SHIMURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect inspecting apparatus
- Publication number 20070216896
- Publication date Sep 20, 2007
- Hitachi High-Technologies Corporation
- Shuichi Chikamatsu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING DEFECTS
- Publication number 20070146696
- Publication date Jun 28, 2007
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR TESTING DEFECTS
- Publication number 20070146697
- Publication date Jun 28, 2007
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing defects
- Publication number 20060030060
- Publication date Feb 9, 2006
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing defects
- Publication number 20060030059
- Publication date Feb 9, 2006
- Minori Noguchi
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for testing defects
- Publication number 20020168787
- Publication date Nov 14, 2002
- Minori Noguchi
- B82 - NANO-TECHNOLOGY

Shuichi Chikamatsu

Person

Patents Grantslast 30 patents

Defect inspection system

Inspection apparatus and inspection method

Defect inspection system

Inspection device and inspection method

Defect inspection method and defect inspection apparatus

Defect inspecting method and apparatus

Inspection apparatus and inspection method

Defect inspection apparatus and defect inspection method

Method of detecting defects on an object

Defect inspection method and defect inspection apparatus

Inspection device and inspection method

Defect inspecting apparatus

Defect inspection system

Apparatus and method for testing defects

Defect inspection apparatus and defect inspection method

Apparatus and method for testing defects

Defect inspecting apparatus

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method for testing defects

Optical apparatus for defect and particle size inspection

Patents Applicationslast 30 patents

INSPECTION APPARATUS

DEFECT INSPECTION SYSTEM

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTION APPARATUS AND INSPECTION METHOD

DEFECT INSPECTION METHOD, AND DEFECT INSPECTION DEVICE

INSPECTION DEVICE AND INSPECTION METHOD

DEFECT INSPECTION SYSTEM

Defect Inspection Method and Defect Inspection Apparatus

DEFECT INSPECTING APPARATUS

Defect Inspection Apparatus and Defect Inspection Method

Apparatus And Method For Testing Defects

Inspection apparatus and inspection method

DEFECT INSPECTING APPARATUS

DEFECT INSPECTION METHOD AND DEFECT INSPECTION APPARATUS

INSPECTION DEVICE AND INSPECTION METHOD

INSPECTING DEVICE AND INSPECTING METHOD

Defect inspection system

Defect Inspection Method and Defect Inspection Apparatus

Defect Inspection Apparatus and Defect Inspection Method

Defect inspecting apparatus

APPARATUS AND METHOD FOR TESTING DEFECTS

APPARATUS AND METHOD FOR TESTING DEFECTS

Apparatus and method for testing defects

Apparatus and method for testing defects

Apparatus and method for testing defects