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Shuichi Kamiyama

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  • Yokohama, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Measuring head
    • Patent number 10,551,184
    • Issue date Feb 4, 2020
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measurement probe and measuring device
    • Patent number 10,415,947
    • Issue date Sep 17, 2019
    • Mitutoyo Corporation
    • Hideyuki Arai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Surface texture measuring apparatus
    • Patent number 10,295,337
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dial gauge inspection machine
    • Patent number D784170
    • Issue date Apr 18, 2017
    • Mitutoyo Corporation
    • Shuichi Kamiyama
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D712761
    • Issue date Sep 9, 2014
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Coordinates measuring head unit and coordinates measuring machine
    • Patent number 8,650,767
    • Issue date Feb 18, 2014
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring head
    • Patent number D659575
    • Issue date May 15, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D659574
    • Issue date May 15, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Measuring head
    • Patent number D659572
    • Issue date May 15, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Stage apparatus and vision measuring apparatus
    • Patent number 7,430,050
    • Issue date Sep 30, 2008
    • Mitutoyo Corporation
    • Shuichi Kamiyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Alignment adjuster of probe, measuring instrument and alignment adj...
    • Patent number 7,099,008
    • Issue date Aug 29, 2006
    • Mitutoyo Corporation
    • Yoshihiko Takahashi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents