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Shuichi Takeuchi
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Hitachinaka, JP
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Patents Grants
last 30 patents
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Patent Grant
Scanning electron microscope
Patent number
7,705,302
Issue date
Apr 27, 2010
Hitachi High-Technologies Corporation
Yasuko Aoki
G01 - MEASURING TESTING
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Patent Grant
Scanning electron microscope and sample observing method using it
Patent number
6,963,067
Issue date
Nov 8, 2005
Hitachi High-Technologies Corporation
Shuichi Takeuchi
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Scanning Electron Microscope
Publication number
20080191135
Publication date
Aug 14, 2008
Hitachi High-Technologies Corporation
Yasuko Aoki
G01 - MEASURING TESTING
Information
Patent Application
Scanning electron microscope and sample observing method using it
Publication number
20040188611
Publication date
Sep 30, 2004
Shuichi Takeuchi
H01 - BASIC ELECTRIC ELEMENTS