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Shuichi Yamashita
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Kariya-city, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Liquid component sensor
Patent number
9,074,996
Issue date
Jul 7, 2015
Denso Corporation
Shuichi Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Fabry-Perot interferometer
Patent number
8,994,955
Issue date
Mar 31, 2015
Denso Corporation
Tomoki Tanemura
G01 - MEASURING TESTING
Information
Patent Grant
Optical waveguide sensor and manufacturing method of the same
Patent number
8,542,957
Issue date
Sep 24, 2013
Denso Corporation
Shuichi Yamashita
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for judging degradation of storage battery
Patent number
7,507,497
Issue date
Mar 24, 2009
Denso Corporation
Shuichi Yamashita
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL COMPONENT
Publication number
20170184707
Publication date
Jun 29, 2017
Denso Corporation
Makiko SUGIURA
G01 - MEASURING TESTING
Information
Patent Application
LENS AND MANUFACTURING METHOD FOR THE SAME
Publication number
20150090862
Publication date
Apr 2, 2015
DENSO CORPORATION
Takayuki MATSUI
G02 - OPTICS
Information
Patent Application
FABRY-PEROT INTERFEROMETER
Publication number
20130335748
Publication date
Dec 19, 2013
Tomoki TANEMURA
G01 - MEASURING TESTING
Information
Patent Application
LIQUID COMPONENT SENSOR
Publication number
20130320214
Publication date
Dec 5, 2013
DENSO CORPORATION
Shuichi YAMASHITA
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL WAVEGUIDE SENSOR AND MANUFACTURING METHOD OF THE SAME
Publication number
20110268385
Publication date
Nov 3, 2011
DENSO CORPORATION
Shuichi YAMASHITA
G02 - OPTICS
Information
Patent Application
Physical quantity sensor element
Publication number
20090013801
Publication date
Jan 15, 2009
DENSO CORPORATION
Shuichi Yamashita
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for judging degradation of storage battery
Publication number
20070054177
Publication date
Mar 8, 2007
DENSO CORPORATION
Shuichi Yamashita
G01 - MEASURING TESTING
Information
Patent Application
Method for etching semiconductor substrate
Publication number
20040192050
Publication date
Sep 30, 2004
DENSO Corporation
Shuichi Yamashita
H01 - BASIC ELECTRIC ELEMENTS