Shuichi Yuasa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Sample holder and charged particle beam system
- Patent number 12,112,917
- Issue date Oct 8, 2024
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 11,631,569
- Issue date Apr 18, 2023
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and electron microscope
- Patent number 10,504,690
- Issue date Dec 10, 2019
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Actuator, sample positioning device, and charged particle beam system
- Patent number 9,618,101
- Issue date Apr 11, 2017
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample introduction device and charged particle beam instrument
- Patent number 9,349,568
- Issue date May 24, 2016
- Jeol Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam System
- Publication number 20220223371
- Publication date Jul 14, 2022
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transport Device and Charged Particle Beam System
- Publication number 20220223369
- Publication date Jul 14, 2022
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder and Charged Particle Beam System
- Publication number 20220223370
- Publication date Jul 14, 2022
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Actuator, Sample Positioning Device, and Charged Particle Beam System
- Publication number 20210156457
- Publication date May 27, 2021
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder and Electron Microscope
- Publication number 20180374671
- Publication date Dec 27, 2018
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Actuator, Sample Positioning Device, and Charged Particle Beam System
- Publication number 20160186844
- Publication date Jun 30, 2016
- JEOL Ltd.
- Shuichi Yuasa
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
Sample Introduction Device and Charged Particle Beam Instrument
- Publication number 20140290393
- Publication date Oct 2, 2014
- JEOL Ltd.
- Shuichi Yuasa
- H01 - BASIC ELECTRIC ELEMENTS

Shuichi Yuasa

Person

Patents Grantslast 30 patents

Sample holder and charged particle beam system

Charged particle beam system

Sample holder and electron microscope

Actuator, sample positioning device, and charged particle beam system

Sample introduction device and charged particle beam instrument

Patents Applicationslast 30 patents

Charged Particle Beam System

Transport Device and Charged Particle Beam System

Sample Holder and Charged Particle Beam System

Actuator, Sample Positioning Device, and Charged Particle Beam System

Sample Holder and Electron Microscope

Actuator, Sample Positioning Device, and Charged Particle Beam System

Sample Introduction Device and Charged Particle Beam Instrument