Shuiqing Hu

Person

Santa Barbara, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Torsion wing probe assembly
- Patent number 11,555,827
- Issue date Jan 17, 2023
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
Torsion wing probe assembly
- Patent number 11,119,118
- Issue date Sep 14, 2021
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 11,002,757
- Issue date May 11, 2021
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 10,663,483
- Issue date May 26, 2020
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,502,761
- Issue date Dec 10, 2019
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 10,197,596
- Issue date Feb 5, 2019
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sample vessel retention structure for scanning probe microscope
- Patent number 10,175,263
- Issue date Jan 8, 2019
- Bruker Nano, Inc.
- Charles Meyer
- G02 - OPTICS
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,995,765
- Issue date Jun 12, 2018
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Force measurement with real-time baseline determination
- Patent number 9,910,064
- Issue date Mar 6, 2018
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,869,694
- Issue date Jan 16, 2018
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,810,713
- Issue date Nov 7, 2017
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus to compensate for deflection artifacts in an a...
- Patent number 9,739,799
- Issue date Aug 22, 2017
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,588,136
- Issue date Mar 7, 2017
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Force measurement with real-time baseline determination
- Patent number 9,575,090
- Issue date Feb 21, 2017
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,322,842
- Issue date Apr 26, 2016
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 9,291,640
- Issue date Mar 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 9,274,139
- Issue date Mar 1, 2016
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of electrical property measurement using an AF...
- Patent number 9,213,047
- Issue date Dec 15, 2015
- Bruker Nano, Inc.
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of tuning a scanning probe microscope
- Patent number 9,116,167
- Issue date Aug 25, 2015
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of tuning a scanning probe microscope
- Patent number 8,997,259
- Issue date Mar 31, 2015
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 8,739,309
- Issue date May 27, 2014
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus of using peak force tapping mode to measure ph...
- Patent number 8,650,660
- Issue date Feb 11, 2014
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus of operating a scanning probe microscope
- Patent number 8,646,109
- Issue date Feb 4, 2014
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Torsion Wing Probe Assembly
- Publication number 20220107339
- Publication date Apr 7, 2022
- Bruker Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Application
Device, and Method of Manufacture, for use in Mechanically Cleaning...
- Publication number 20210396784
- Publication date Dec 23, 2021
- Bruker Nano, Inc.
- Weijie Wang
- G01 - MEASURING TESTING
Information Patent Application
Torsion Wing Probe Assembly
- Publication number 20200348333
- Publication date Nov 5, 2020
- Bruke Nano, Inc.
- Shuiqing Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20200191826
- Publication date Jun 18, 2020
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190212361
- Publication date Jul 11, 2019
- BRUKER NANO, INC.
- Charles MEYER
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20190018040
- Publication date Jan 17, 2019
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20180188286
- Publication date Jul 5, 2018
- Bruker Nano, Inc.
- Charles MEYER
- G02 - OPTICS
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20180136251
- Publication date May 17, 2018
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20170242052
- Publication date Aug 24, 2017
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Force Measurement with Real-Time Baseline Determination
- Publication number 20170227577
- Publication date Aug 10, 2017
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160313367
- Publication date Oct 27, 2016
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20160274144
- Publication date Sep 22, 2016
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20160258979
- Publication date Sep 8, 2016
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20160178659
- Publication date Jun 23, 2016
- Bruker Nano, Inc.
- Chunzeng Li
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Tuning a Scanning Probe Microscope
- Publication number 20160109477
- Publication date Apr 21, 2016
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus to Compensate for Deflection Artifacts in an A...
- Publication number 20150247881
- Publication date Sep 3, 2015
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE
- Publication number 20150204902
- Publication date Jul 23, 2015
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Force Measurement with Real-Time Baseline Determination
- Publication number 20150160259
- Publication date Jun 11, 2015
- Bruker Nano, Inc.
- Changchun Liu
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20140283229
- Publication date Sep 18, 2014
- Bruker Nano, Inc.
- Yan Hu
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20140230103
- Publication date Aug 14, 2014
- Bruker Nano, Inc.
- Chanmin Su
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus of Operating a Scanning Probe Microscope
- Publication number 20140223615
- Publication date Aug 7, 2014
- Bruker Nano, Inc.
- Jian Shi
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Electrical Property Measurement Using an AF...
- Publication number 20130276174
- Publication date Oct 17, 2013
- Chunzeng Li
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method And Apparatus Of Tuning A Scanning Probe Microscope
- Publication number 20130125269
- Publication date May 16, 2013
- Bruker Nano, Inc.
- Chanmin Su
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...
- Publication number 20120131702
- Publication date May 24, 2012
- Bruker Nano, Inc.
- Jian Shi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE
- Publication number 20110167524
- Publication date Jul 7, 2011
- Bruker Nano, Inc.
- Yan Hu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE
- Publication number 20100122385
- Publication date May 13, 2010
- VEECO INSTRUMENTS INC.
- Yan Hu
- G01 - MEASURING TESTING

Shuiqing Hu

Person

Patents Grantslast 30 patents

Torsion wing probe assembly

Torsion wing probe assembly

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Sample vessel retention structure for scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Force measurement with real-time baseline determination

Method and apparatus of electrical property measurement using an AF...

Method and apparatus of operating a scanning probe microscope

Method and apparatus to compensate for deflection artifacts in an a...

Method and apparatus of operating a scanning probe microscope

Force measurement with real-time baseline determination

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Method and apparatus of electrical property measurement using an AF...

Method and apparatus of tuning a scanning probe microscope

Method and apparatus of tuning a scanning probe microscope

Method and apparatus of operating a scanning probe microscope

Method and apparatus of using peak force tapping mode to measure ph...

Method and apparatus of operating a scanning probe microscope

Patents Applicationslast 30 patents

Torsion Wing Probe Assembly

Device, and Method of Manufacture, for use in Mechanically Cleaning...

Torsion Wing Probe Assembly

Method and Apparatus of Operating a Scanning Probe Microscope

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Operating a Scanning Probe Microscope

Force Measurement with Real-Time Baseline Determination

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Method and Apparatus of Tuning a Scanning Probe Microscope

Method and Apparatus to Compensate for Deflection Artifacts in an A...

METHOD AND APPARATUS OF TUNING A SCANNING PROBE MICROSCOPE

Force Measurement with Real-Time Baseline Determination

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

Method and Apparatus of Operating a Scanning Probe Microscope

Method and Apparatus of Electrical Property Measurement Using an AF...

Method And Apparatus Of Tuning A Scanning Probe Microscope

Method and Apparatus of Using Peak Force Tapping Mode to Measure Ph...

METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE

METHOD AND APPARATUS OF OPERATING A SCANNING PROBE MICROSCOPE