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Shuji HAYASHIDA

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  • Kawasaki-shi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Measurement apparatus and bearing
    • Patent number 10,907,948
    • Issue date Feb 2, 2021
    • Mitutoyo Corporation
    • Shuji Hayashida
    • F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
  • Information Patent Grant

    Connection unit for connecting external device to measurement device
    • Patent number 10,866,126
    • Issue date Dec 15, 2020
    • Mitutoyo Corporation
    • Keisuke Iori
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    External device for measuring instrument
    • Patent number 10,451,450
    • Issue date Oct 22, 2019
    • Mitutoyo Corporation
    • Atsuya Niwano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument
    • Patent number 10,295,324
    • Issue date May 21, 2019
    • Mitutoyo Corporation
    • Koji Matsumoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Connection unit for connecting external device to measurement devic...
    • Patent number 10,283,922
    • Issue date May 7, 2019
    • Mitutoyo Corporation
    • Atsuya Niwano
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 9,404,724
    • Issue date Aug 2, 2016
    • Mitutoyo Corporation
    • Yasuhiro Tsujimoto
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument
    • Patent number 9,121,682
    • Issue date Sep 1, 2015
    • Mitutoyo Corporation
    • Nobuyuki Hayashi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dust-proof structure for measuring tool
    • Patent number 9,016,122
    • Issue date Apr 28, 2015
    • Mitutoyo Corporation
    • Rie Arai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital indicator and multipoint measuring apparatus
    • Patent number 8,943,703
    • Issue date Feb 3, 2015
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer
    • Patent number 8,844,153
    • Issue date Sep 30, 2014
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Dust-proof structure for measuring tool
    • Patent number 8,689,628
    • Issue date Apr 8, 2014
    • Mitutoyo Corporation
    • Rie Arai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Stand for a micrometer
    • Patent number D678033
    • Issue date Mar 19, 2013
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D08 - Tools and hardware
  • Information Patent Grant

    Stand for a micrometer
    • Patent number D678090
    • Issue date Mar 19, 2013
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number 8,296,966
    • Issue date Oct 30, 2012
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Heat insulating cover and micrometer
    • Patent number 8,245,413
    • Issue date Aug 21, 2012
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Knob for a stand for measuring instruments
    • Patent number D657654
    • Issue date Apr 17, 2012
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • D08 - Tools and hardware
  • Information Patent Grant

    Heat-insulating cover for micrometer
    • Patent number D653134
    • Issue date Jan 31, 2012
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Inside diameter measuring tool
    • Patent number 8,033,032
    • Issue date Oct 11, 2011
    • Mitutoyo Corporation
    • Yuji Fujikawa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 8,001,698
    • Issue date Aug 23, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 7,877,894
    • Issue date Feb 1, 2011
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Measuring instrument
    • Patent number 7,721,455
    • Issue date May 25, 2010
    • Mitutoyo Corporation
    • Sadayuki Matsumiya
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Caliper
    • Patent number D611850
    • Issue date Mar 16, 2010
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Caliper
    • Patent number D611370
    • Issue date Mar 9, 2010
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Micrometer
    • Patent number D611371
    • Issue date Mar 9, 2010
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Caliper
    • Patent number D610928
    • Issue date Mar 2, 2010
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Absolute position measuring apparatus
    • Patent number 7,584,551
    • Issue date Sep 8, 2009
    • Mitutoyo Corporation
    • Masamichi Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital indicator and method for using the digital indicator
    • Patent number 7,578,072
    • Issue date Aug 25, 2009
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 7,552,544
    • Issue date Jun 30, 2009
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Micrometer
    • Patent number D584177
    • Issue date Jan 6, 2009
    • Mitutoyo Corporation
    • Shigeru Ohtani
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Digital displacement measuring instrument
    • Patent number 7,467,480
    • Issue date Dec 23, 2008
    • Mitutoyo Corporation
    • Shuji Hayashida
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents