Shuji Kawai

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Electron microscope and specimen tilt angle adjustment method
- Patent number 10,867,771
- Issue date Dec 15, 2020
- Jeol Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam system
- Patent number 10,529,530
- Issue date Jan 7, 2020
- Jeol Ltd.
- Shuji Kawai
- G01 - MEASURING TESTING
Information Patent Grant
Charged Particle Beam System With Receptacle Chamber For Cleaning S...
- Patent number 9,881,768
- Issue date Jan 30, 2018
- Jeol Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic method of axial adjustments in electron beam system
- Patent number 7,659,507
- Issue date Feb 9, 2010
- Jeol Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Electron Microscope and Specimen Orientation Alignment Method
- Publication number 20240087840
- Publication date Mar 14, 2024
- JEOL Ltd.
- Motofumi Saitoh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Microscope and Specimen Tilt Angle Adjustment Method
- Publication number 20190115187
- Publication date Apr 18, 2019
- JEOL Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam System
- Publication number 20170236680
- Publication date Aug 17, 2017
- JEOL Ltd.
- Shuji Kawai
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam System
- Publication number 20170133197
- Publication date May 11, 2017
- JEOL Ltd.
- Shuji Kawai
- G01 - MEASURING TESTING
Information Patent Application
Automatic Method of Axial Adjustments in Electron Beam System
- Publication number 20080078943
- Publication date Apr 3, 2008
- JEOL Ltd.
- Shuji Kawai
- H01 - BASIC ELECTRIC ELEMENTS