Shuji Yamaoka

Person

Fukuyama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Wire harness checker and wire harness checking method
- Patent number 7,495,452
- Issue date Feb 24, 2009
- SUMITOMO WIRING SYSTEMS, LTD.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Grant
Conductor inspection apparatus and conductor inspection method
- Patent number 7,332,914
- Issue date Feb 19, 2008
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electronic circuits
- Patent number 7,239,127
- Issue date Jul 3, 2007
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Sensor for inspection instrument and inspection instrument
- Patent number 7,173,445
- Issue date Feb 6, 2007
- OHT Inc.
- Tatsuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspection
- Patent number 7,138,805
- Issue date Nov 21, 2006
- OHT, Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Circuit pattern inspection instrument and pattern inspection method
- Patent number 7,088,107
- Issue date Aug 8, 2006
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Low-noise active RC signal processing circuit
- Patent number 7,026,870
- Issue date Apr 11, 2006
- OHT, Inc.
- Masataka Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Circuit pattern inspection apparatus, circuit pattern inspection me...
- Patent number 6,995,566
- Issue date Feb 7, 2006
- OHT, Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for substrate displacement detection
- Patent number 6,992,493
- Issue date Jan 31, 2006
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for inspecting circuit board
- Patent number 6,972,573
- Issue date Dec 6, 2005
- OHT Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electronic circuits
- Patent number 6,967,498
- Issue date Nov 22, 2005
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus and inspecting method for circuit board
- Patent number 6,958,619
- Issue date Oct 25, 2005
- OHT, Inc.
- Shuji Yamaoka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Inspection method and apparatus for testing fine pitch traces
- Patent number 6,952,104
- Issue date Oct 4, 2005
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting electrical continuity of circui...
- Patent number 6,947,853
- Issue date Sep 20, 2005
- OHT, Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Circuit pattern inspection device, circuit pattern inspection metho...
- Patent number 6,943,559
- Issue date Sep 13, 2005
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Electronic circuit inspection sensor and inspection system using same
- Patent number 6,933,740
- Issue date Aug 23, 2005
- OHT, Inc.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic imager
- Patent number 6,921,892
- Issue date Jul 26, 2005
- Varian Medical Systems, Inc.
- Richard Colbeth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspecting apparatus and inspecting method for circuit board
- Patent number 6,842,026
- Issue date Jan 11, 2005
- OHT, Inc.
- Shuji Yamaoka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Method and apparatus for circuit board continuity test, tool for co...
- Patent number 6,825,673
- Issue date Nov 30, 2004
- OHT Inc.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and sensor
- Patent number 6,734,692
- Issue date May 11, 2004
- OHT Inc.
- Tatuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection
- Patent number 6,710,607
- Issue date Mar 23, 2004
- OHT, Inc.
- Tatuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, inspection method and inspection unit therefor
- Patent number 6,703,849
- Issue date Mar 9, 2004
- OHT Inc.
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Grant
Sensor probe for use in board inspection and manufacturing method t...
- Patent number 6,614,250
- Issue date Sep 2, 2003
- OHT Inc.
- Yuji Odan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Wire harness checker and wire harness checking method
- Publication number 20070184686
- Publication date Aug 9, 2007
- SUMITOMO WIRING SYSTEMS, LTD.
- Mishio Hayashi
- G01 - MEASURING TESTING
Information Patent Application
Conductior position inspection apparatus and conductor position ins...
- Publication number 20070073512
- Publication date Mar 29, 2007
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Conductor inspection apparatus and conductor inspection method
- Publication number 20060226851
- Publication date Oct 12, 2006
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Circuit pattern inspection instrument and pattern inspection method
- Publication number 20060055413
- Publication date Mar 16, 2006
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Circuit pattern inspection device and circuit pattern inspection me...
- Publication number 20060043153
- Publication date Mar 2, 2006
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting electrical continuity of circui...
- Publication number 20050038613
- Publication date Feb 17, 2005
- OHT INC.
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Tester and testing method
- Publication number 20040243345
- Publication date Dec 2, 2004
- OHT INC.
- Tatsuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Application
Tester and testing method
- Publication number 20040240724
- Publication date Dec 2, 2004
- Tatsuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Application
Circuit wiring inspetion instrument and circuit wiring inspecting m...
- Publication number 20040234121
- Publication date Nov 25, 2004
- Tatsuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Application
Low-noise active rc signal processing circuit
- Publication number 20040164796
- Publication date Aug 26, 2004
- Masataka Nakamura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Circuit pattern inspection device, circuit pattern inspection metho...
- Publication number 20040164755
- Publication date Aug 26, 2004
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Circuit pattern inspection apparatus, circuit pattern inspection me...
- Publication number 20040150409
- Publication date Aug 5, 2004
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Device and method for substrate displacement detection
- Publication number 20040153282
- Publication date Aug 5, 2004
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic imager
- Publication number 20040118991
- Publication date Jun 24, 2004
- Richard Colbeth
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Inspection apparatus and inspection method
- Publication number 20040095144
- Publication date May 20, 2004
- Shuji Yamaoka
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting electronic circuits
- Publication number 20040027142
- Publication date Feb 12, 2004
- HOT INC,.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting electronic circuits
- Publication number 20040027143
- Publication date Feb 12, 2004
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Application
Sensor probe for use in board inspection and manufacturing method t...
- Publication number 20040027146
- Publication date Feb 12, 2004
- OHT INC.
- Yuji Odan
- G01 - MEASURING TESTING
Information Patent Application
Inspecting apparatus and inspecting method for circuit board
- Publication number 20030001561
- Publication date Jan 2, 2003
- Shuji Yamaoka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Inspecting apparatus and inspecting method for circuit board
- Publication number 20030001562
- Publication date Jan 2, 2003
- Shuji Yamaoka
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
Device and method for inspection
- Publication number 20020163342
- Publication date Nov 7, 2002
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Application
Device and method for inspecting circuit board
- Publication number 20020163341
- Publication date Nov 7, 2002
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus, inspection method and inspection unit therefor
- Publication number 20020140442
- Publication date Oct 3, 2002
- Shogo Ishioka
- G01 - MEASURING TESTING
Information Patent Application
Inspection apparatus and sensor
- Publication number 20020140448
- Publication date Oct 3, 2002
- Tatuhisa Fujii
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspection
- Publication number 20020135390
- Publication date Sep 26, 2002
- Tatuhisa Fujii
- G01 - MEASURING TESTING

Shuji Yamaoka

Person

Patents Grantslast 30 patents

Wire harness checker and wire harness checking method

Conductor inspection apparatus and conductor inspection method

Apparatus and method for inspecting electronic circuits

Sensor for inspection instrument and inspection instrument

Device and method for inspection

Circuit pattern inspection instrument and pattern inspection method

Low-noise active RC signal processing circuit

Circuit pattern inspection apparatus, circuit pattern inspection me...

Device and method for substrate displacement detection

Device and method for inspecting circuit board

Apparatus and method for inspecting electronic circuits

Inspecting apparatus and inspecting method for circuit board

Inspection method and apparatus for testing fine pitch traces

Apparatus and method for inspecting electrical continuity of circui...

Circuit pattern inspection device, circuit pattern inspection metho...

Electronic circuit inspection sensor and inspection system using same

Electrostatic imager

Inspecting apparatus and inspecting method for circuit board

Method and apparatus for circuit board continuity test, tool for co...

Inspection apparatus and sensor

Method and apparatus for inspection

Inspection apparatus, inspection method and inspection unit therefor

Sensor probe for use in board inspection and manufacturing method t...

Patents Applicationslast 30 patents

Wire harness checker and wire harness checking method

Conductior position inspection apparatus and conductor position ins...

Conductor inspection apparatus and conductor inspection method

Circuit pattern inspection instrument and pattern inspection method

Circuit pattern inspection device and circuit pattern inspection me...

Apparatus and method for inspecting electrical continuity of circui...

Tester and testing method

Tester and testing method

Circuit wiring inspetion instrument and circuit wiring inspecting m...

Low-noise active rc signal processing circuit

Circuit pattern inspection device, circuit pattern inspection metho...

Circuit pattern inspection apparatus, circuit pattern inspection me...

Device and method for substrate displacement detection

Electrostatic imager

Inspection apparatus and inspection method

Apparatus and method for inspecting electronic circuits

Apparatus and method for inspecting electronic circuits

Sensor probe for use in board inspection and manufacturing method t...

Inspecting apparatus and inspecting method for circuit board

Inspecting apparatus and inspecting method for circuit board

Device and method for inspection

Device and method for inspecting circuit board

Inspection apparatus, inspection method and inspection unit therefor

Inspection apparatus and sensor

Method and apparatus for inspection