Shun-ichi Hiraki

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of rendering the impurity concentration of a semiconductor w...
- Patent number 5,130,261
- Issue date Jul 14, 1992
- Kabushiki Kaisha Toshiba
- Yoshikazu Usuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 5,015,593
- Issue date May 14, 1991
- Kabushiki Kaisha Toshiba
- Shigeo Yawata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling lifetime of minority carriers by electron bea...
- Patent number 4,585,489
- Issue date Apr 29, 1986
- Kabushiki Kaisha Toshiba
- Shun-ichi Hiraki
- H01 - BASIC ELECTRIC ELEMENTS