Shun-Ker Wu

Person

Taoyuan, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Electronic device, memory device, and write leveling method thereof
- Patent number 12,125,557
- Issue date Oct 22, 2024
- NANYA TECHNOLOGY CORPORATION
- Shun-Ke Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory and method of adjusting read timing thereof
- Patent number 9,036,434
- Issue date May 19, 2015
- Nanya Technology Corporation
- Shun-Ker Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus for electronic device package and method for testing...
- Patent number 8,058,888
- Issue date Nov 15, 2011
- Nanya Technology Corporation
- Shun-Ker Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing semiconductor memory device
- Patent number 7,813,195
- Issue date Oct 12, 2010
- Nanya Technology Corp.
- Shun-Ke Wu
- G11 - INFORMATION STORAGE
Information Patent Grant
Test system and method for reducing test signal loss for integrated...
- Patent number 7,663,391
- Issue date Feb 16, 2010
- Nanya Technology Corp.
- Shun-Ker Wu
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 7,459,925
- Issue date Dec 2, 2008
- Nanya Technology Corp.
- Shun-Ker Wu
- G01 - MEASURING TESTING
Information Patent Grant
Method of driving and testing a semiconductor memory device
- Patent number 6,940,769
- Issue date Sep 6, 2005
- Nanya Technology Corporation
- Shun-Ker Wu
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ELECTRONIC DEVICE, MEMORY DEVICE, AND WRITE LEVELING METHOD THEREOF
- Publication number 20240265955
- Publication date Aug 8, 2024
- NANYA TECHNOLOGY CORPORATION
- Shun-Ke WU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CIRCUIT, SIGNAL TRANSMISSION SYSTEM AND SIGNAL TRANSMISSION...
- Publication number 20240233799
- Publication date Jul 11, 2024
- NANYA TECHNOLOGY CORPORATION
- Shun-Ke WU
- G11 - INFORMATION STORAGE
Information Patent Application
RANDOM ACCESS MEMORY AND METHOD OF ADJUSTING READ TIMING THEREOF
- Publication number 20150117127
- Publication date Apr 30, 2015
- Nanya Technology Cop.
- Shun-Ker Wu
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS FOR ELECTRONIC DEVICE PACKAGE AND METHOD FOR TESTING...
- Publication number 20110084720
- Publication date Apr 14, 2011
- NANYA TECHNOLOGY CORPORATION
- Shun-Ker Wu
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND METHOD FOR REDUCING TEST SIGNAL LOSS FOR INTEGRATED...
- Publication number 20090102496
- Publication date Apr 23, 2009
- Shun-Ker Wu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE
- Publication number 20090003102
- Publication date Jan 1, 2009
- NANYA Technology Corp.
- Shun-Ke WU
- G11 - INFORMATION STORAGE
Information Patent Application
Method of driving and testing a semiconductor memory device
- Publication number 20050063229
- Publication date Mar 24, 2005
- Shun-Ker Wu
- G11 - INFORMATION STORAGE

Shun-Ker Wu

Person

Patents Grantslast 30 patents

Electronic device, memory device, and write leveling method thereof

Random access memory and method of adjusting read timing thereof

Test apparatus for electronic device package and method for testing...

Method for testing semiconductor memory device

Test system and method for reducing test signal loss for integrated...

Probe card

Method of driving and testing a semiconductor memory device

Patents Applicationslast 30 patents

ELECTRONIC DEVICE, MEMORY DEVICE, AND WRITE LEVELING METHOD THEREOF

MEMORY CIRCUIT, SIGNAL TRANSMISSION SYSTEM AND SIGNAL TRANSMISSION...

RANDOM ACCESS MEMORY AND METHOD OF ADJUSTING READ TIMING THEREOF

TEST APPARATUS FOR ELECTRONIC DEVICE PACKAGE AND METHOD FOR TESTING...

TEST SYSTEM AND METHOD FOR REDUCING TEST SIGNAL LOSS FOR INTEGRATED...

METHOD FOR TESTING SEMICONDUCTOR MEMORY DEVICE

Method of driving and testing a semiconductor memory device