Shun-Miin (Sam) Wang

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for shifting at-speed scan patterns in a scan-...
- Patent number 7,512,851
- Issue date Mar 31, 2009
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Smart capture for ATPG (automatic test pattern generation) and faul...
- Patent number 7,124,342
- Issue date Oct 17, 2006
- Syntest Technologies, Inc.
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Grant
Mask network design for scan-based integrated circuits
- Patent number 7,032,148
- Issue date Apr 18, 2006
- Syntest Technologies, Inc.
- Laung-Terng (L.-T.) Wang
- G01 - MEASURING TESTING