Shun-Miin Wang

Follow

Person

San Jose, CA, US

People

Patents Applicationslast 30 patents

Information Patent Application
Smart capture for ATPG (automatic test pattern generation) and faul...
- Publication number 20050262409
- Publication date Nov 24, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
Mask network design for scan-based integrated circuits
- Publication number 20050060625
- Publication date Mar 17, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for shifting at-speed scan patterns in a scan-...
- Publication number 20050055617
- Publication date Mar 10, 2005
- Laung-Terng Wang
- G01 - MEASURING TESTING