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Shunichi Miyazaki
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Musashino-shi, Tokyo, JP
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Patent Application
TEMPERATURE MEASUREMENT APPARATUS, TEMPERATURE MEASUREMENT SYSTEM,...
Publication number
20220034723
Publication date
Feb 3, 2022
YOKOGAWA ELECTRIC CORPORATION
Junichi OGAWA
G01 - MEASURING TESTING
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Patent Application
OPTICAL ANALYSIS SYSTEM AND OPTICAL ANALYSIS METHOD
Publication number
20210247302
Publication date
Aug 12, 2021
Yokogawa Electric Corporation
Kodai Murayama
G01 - MEASURING TESTING