TREA

Shunichi WAKAMATSU

Follow

Person

  • Saitama, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Substance detection system and substance detection method
    • Patent number 11,156,571
    • Issue date Oct 26, 2021
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing sensor, information processing device, sensing method, and...
    • Patent number 10,613,008
    • Issue date Apr 7, 2020
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing sensor
    • Patent number 10,126,268
    • Issue date Nov 13, 2018
    • Nihon Dempa Kogyo Co., Ltd.
    • Wakako Shinobu
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Sensing device
    • Patent number 9,791,412
    • Issue date Oct 17, 2017
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Radiation detector
    • Patent number D755653
    • Issue date May 10, 2016
    • Nihon Dempa Kogyo Co., Ltd.
    • Kiyoto Shinmei
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Sensing device, sensing system, and sensing method
    • Patent number 9,164,063
    • Issue date Oct 20, 2015
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method for detecting microorganisms and microorganism detecting app...
    • Patent number 9,103,748
    • Issue date Aug 11, 2015
    • Nihon Dempa Kogyo Co., Ltd.
    • Mitsuaki Koyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 9,086,338
    • Issue date Jul 21, 2015
    • Nihon Dempa Kogyo Co., Ltd.
    • Wakako Shinobu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Method of detecting microorganisms and microorganism detecting appa...
    • Patent number 8,802,428
    • Issue date Aug 12, 2014
    • Nihon Dempa Kogyo Co., Ltd.
    • Mitsuaki Koyama
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 8,646,317
    • Issue date Feb 11, 2014
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 8,601,859
    • Issue date Dec 10, 2013
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device and sensing method
    • Patent number 8,601,860
    • Issue date Dec 10, 2013
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 8,454,902
    • Issue date Jun 4, 2013
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 8,377,380
    • Issue date Feb 19, 2013
    • Nihon Dempa Kogyo Co., Ltd.
    • Tomoya Yorita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing sensor and concentration measuring device
    • Patent number 8,352,198
    • Issue date Jan 8, 2013
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 8,256,274
    • Issue date Sep 4, 2012
    • Nihon Dempa Kogyo Co., Ltd.
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Piezoelectric sensor and sensing instrument
    • Patent number 8,176,772
    • Issue date May 15, 2012
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing instrument
    • Patent number 8,051,714
    • Issue date Nov 8, 2011
    • Nihon Dempa Kogyo Co., Ltd.
    • Naoki Onishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing device
    • Patent number 8,029,741
    • Issue date Oct 4, 2011
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Sensing instrument
    • Patent number 7,982,451
    • Issue date Jul 19, 2011
    • Nihon Dempa Kogyo Co., Ltd.
    • Naoki Onishi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    PLL apparatus
    • Patent number 7,812,651
    • Issue date Oct 12, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    PLL apparatus
    • Patent number 7,755,436
    • Issue date Jul 13, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Naoki Onishi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Sensing device
    • Patent number 7,690,256
    • Issue date Apr 6, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Takehito Ishii
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Grant

    Quartz sensor and sensing device
    • Patent number 7,677,087
    • Issue date Mar 16, 2010
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Bio-sensor
    • Patent number D605535
    • Issue date Dec 8, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shigenori Watanabe
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Bio-sensor
    • Patent number D604185
    • Issue date Nov 17, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shigenori Watanabe
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Crystal resonator for bio-sensor
    • Patent number D603726
    • Issue date Nov 10, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shigenori Watanabe
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Bio-sensor
    • Patent number D603725
    • Issue date Nov 10, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shigenori Watanabe
    • D10 - Measuring, testing, or signalling instruments
  • Information Patent Grant

    Quartz sensor and sensing device
    • Patent number 7,552,639
    • Issue date Jun 30, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Component measuring device
    • Patent number 7,554,247
    • Issue date Jun 30, 2009
    • Nihon Dempa Kogyo Co., Ltd.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    TEMPERATURE DETECTOR
    • Publication number 20200264054
    • Publication date Aug 20, 2020
    • NIHON DEMPA KOGYO CO., LTD.
    • Hiroyuki KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SUBSTANCE DETECTION SYSTEM AND SUBSTANCE DETECTION METHOD
    • Publication number 20190265177
    • Publication date Aug 29, 2019
    • NIHON DEMPA KOGYO CO., LTD.
    • Hiroyuki KUKITA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSING SENSOR, INFORMATION PROCESSING DEVICE, SENSING METHOD, AND...
    • Publication number 20180195942
    • Publication date Jul 12, 2018
    • NIHON DEMPA KOGYO CO., LTD.
    • Shunichi WAKAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING SENSOR
    • Publication number 20170146490
    • Publication date May 25, 2017
    • NIHON DEMPA KOGYO CO., LTD.
    • Wakako SHINOBU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING DEVICE
    • Publication number 20140366611
    • Publication date Dec 18, 2014
    • Hiroyuki KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING SENSOR AND SENSING DEVICE USING PIEZOELECTRIC RESONATOR
    • Publication number 20140250985
    • Publication date Sep 11, 2014
    • NIHON DEMPA KOGYO CO., LTD.
    • WAKAKO SHINOBU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING METHOD
    • Publication number 20140004529
    • Publication date Jan 2, 2014
    • Wakako SHINOBU
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING DEVICE, SENSING SYSTEM, AND SENSING METHOD
    • Publication number 20130042672
    • Publication date Feb 21, 2013
    • NIHON DEMPA KOGYO CO., LTD.
    • HIROYUKI KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING DEVICE
    • Publication number 20120219458
    • Publication date Aug 30, 2012
    • NIHON DEMPA KOGYO CO., LTD
    • Hiroyuki KUKITA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method for detecting microorganisms and microorganism detecting app...
    • Publication number 20120070850
    • Publication date Mar 22, 2012
    • NIHON DEMPA KOGYO CO., LTD
    • Mitsuaki Koyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing device
    • Publication number 20110316522
    • Publication date Dec 29, 2011
    • NIHON DEMPA KOGYO CO., LTD
    • Wakako Shinobu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of detecting microorganisms and microorganism detecting appa...
    • Publication number 20110223620
    • Publication date Sep 15, 2011
    • NIHON DEMPA KOGYO CO., LTD
    • Mitsuaki Koyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing device
    • Publication number 20100329932
    • Publication date Dec 30, 2010
    • NIHON DEMPA KOGYO CO., LTD
    • Tomoya Yorita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing device
    • Publication number 20100329928
    • Publication date Dec 30, 2010
    • NIHON DEMPA KOGYO CO., LTD
    • Tomoya Yorita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing device
    • Publication number 20100319438
    • Publication date Dec 23, 2010
    • NIHON DEMPA KOGYO CO., LTD
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing device
    • Publication number 20100319736
    • Publication date Dec 23, 2010
    • NIHON DEMPA KOGYO CO., LTD
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing device and sensing method
    • Publication number 20100313636
    • Publication date Dec 16, 2010
    • NIHON DEMPA KOGYO CO., LTD
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing Sensor and Concentration Measuring Device
    • Publication number 20100292935
    • Publication date Nov 18, 2010
    • NIHON DEMPA KOGYO CO., LTD.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    PIEZOELECTRIC SENSOR AND SENSING INSTRUMENT
    • Publication number 20100236331
    • Publication date Sep 23, 2010
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING DEVICE
    • Publication number 20100095751
    • Publication date Apr 22, 2010
    • Nihon Dempa Kogyo Co. Ltd
    • Hiroyuki Kukita
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing Device
    • Publication number 20100061893
    • Publication date Mar 11, 2010
    • NIHON DEMPA KOGYO CO., LTD.
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSING INSTRUMENT
    • Publication number 20100021346
    • Publication date Jan 28, 2010
    • NIHON DEMPA KOGYO CO., LTD
    • Shunichi Wakamatsu
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Sensing instrument
    • Publication number 20090308142
    • Publication date Dec 17, 2009
    • Naoki Onishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing method
    • Publication number 20090291509
    • Publication date Nov 26, 2009
    • NIHON DEMPA KOGYO CO., LTD
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Sensing instrument
    • Publication number 20090273335
    • Publication date Nov 5, 2009
    • Naoki Onishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    PLL Apparatus
    • Publication number 20090167382
    • Publication date Jul 2, 2009
    • NIHON DEMPA KOGYO CO., LTD.
    • Shunichi Wakamatsu
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    PLL Apparatus
    • Publication number 20090146742
    • Publication date Jun 11, 2009
    • Naoki Onishi
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Sensing device
    • Publication number 20080156099
    • Publication date Jul 3, 2008
    • Takehito Ishii
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    Quartz Sensor and Sensing Device
    • Publication number 20080134767
    • Publication date Jun 12, 2008
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Component Measuring Device
    • Publication number 20080129148
    • Publication date Jun 5, 2008
    • Shunichi Wakamatsu
    • G01 - MEASURING TESTING