Shunji Bandow

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Aichi, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray analyzer
- Patent number 7,910,888
- Issue date Mar 22, 2011
- SII NanoTechnology Inc.
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing hybrid carbon nanotube
- Patent number 7,384,520
- Issue date Jun 10, 2008
- Japan Science and Technology Corporation
- Sumio Iijima
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYZER
- Publication number 20090184252
- Publication date Jul 23, 2009
- Keiichi Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Method for manufacturing hybrid carbon nanotube
- Publication number 20040065559
- Publication date Apr 8, 2004
- Sumio Iijima
- B82 - NANO-TECHNOLOGY