Shunji Maeda

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Stacked substrate solid state image sensor
- Patent number 11,889,218
- Issue date Jan 30, 2024
- Sony Corporation
- Shunichi Sukegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state image sensor comprising stacked substrates, semiconduct...
- Patent number 11,153,515
- Issue date Oct 19, 2021
- Sony Corporation
- Shunichi Sukegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Solid state image sensor, semiconductor device, and electronic device
- Patent number 10,554,910
- Issue date Feb 4, 2020
- Sony Corporation
- Shunichi Sukegawa
- G01 - MEASURING TESTING
Information Patent Grant
Health management system, fault diagnosis system, health management...
- Patent number 9,933,338
- Issue date Apr 3, 2018
- Hitachi Power Solutions Co., Ltd.
- Toujirou Noda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Anomaly diagnosis method and apparatus
- Patent number 9,779,495
- Issue date Oct 3, 2017
- Hitachi, Ltd.
- Hisae Shibuya
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for reviewing a defect and apparatus
- Patent number 9,733,194
- Issue date Aug 15, 2017
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Grant
Facility state monitoring method and device for same
- Patent number 9,659,250
- Issue date May 23, 2017
- Hitachi Power Solutions Co., Ltd.
- Hisae Shibuya
- G05 - CONTROLLING REGULATING
Information Patent Grant
Anomaly detection and diagnosis/prognosis method, anomaly detection...
- Patent number 9,483,049
- Issue date Nov 1, 2016
- Hitachi, Ltd.
- Shunji Maeda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for inspecting patterns formed on a substrate
- Patent number 8,824,774
- Issue date Sep 2, 2014
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and device thereof
- Patent number 8,811,712
- Issue date Aug 19, 2014
- Hitachi High-Technologies Corporation
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,755,041
- Issue date Jun 17, 2014
- Hitachi High-Technologies Corporation
- Yuta Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for inspecting pattern defect and device for realizing the same
- Patent number 8,748,795
- Issue date Jun 10, 2014
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field defect inspecting method, dark-field defect inspecting a...
- Patent number 8,681,328
- Issue date Mar 25, 2014
- Hitachi High-Technologies Corporation
- Atsushi Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for monitoring the state of a facility
- Patent number 8,682,824
- Issue date Mar 25, 2014
- Hitachi, Ltd.
- Hisae Shibuya
- G05 - CONTROLLING REGULATING
Information Patent Grant
Defect classification method and apparatus, and defect inspection a...
- Patent number 8,660,340
- Issue date Feb 25, 2014
- Hitachi High-Technologies Corporation
- Hisae Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting method and inspecting apparatus for substrate surface
- Patent number 8,654,350
- Issue date Feb 18, 2014
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus of inspecting defect in semiconductor and method of the same
- Patent number 8,643,834
- Issue date Feb 4, 2014
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting pattern defects
- Patent number 8,639,019
- Issue date Jan 28, 2014
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device and defect inspection method
- Patent number 8,634,069
- Issue date Jan 21, 2014
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Error detection method and its system for early detection of errors...
- Patent number 8,630,962
- Issue date Jan 14, 2014
- Hitachi, Ltd.
- Shunji Maeda
- G05 - CONTROLLING REGULATING
Information Patent Grant
Visual inspection method and apparatus and image analysis system
- Patent number 8,620,061
- Issue date Dec 31, 2013
- Hitachi High-Technologies Corporation
- Hisae Shibuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault inspection method
- Patent number 8,582,864
- Issue date Nov 12, 2013
- Hitachi High-Technologies Corporation
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and equipment for detecting pattern defect
- Patent number 8,553,214
- Issue date Oct 8, 2013
- Hitachi, Ltd.
- Hiroaki Shishido
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspecting patterns formed on a substrate
- Patent number 8,467,594
- Issue date Jun 18, 2013
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for detecting defects
- Patent number 8,462,330
- Issue date Jun 11, 2013
- Hitachi High-Technologies Corporation
- Hiroyuki Nakano
- G01 - MEASURING TESTING
Information Patent Grant
Defect classification method and apparatus, and defect inspection a...
- Patent number 8,437,534
- Issue date May 7, 2013
- Hitachi High-Technologies Corporation
- Hisae Shibuya
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus
- Patent number 8,427,634
- Issue date Apr 23, 2013
- Hitachi High-Technologies Corporation
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Pattern defect inspection method and its apparatus
- Patent number 8,410,460
- Issue date Apr 2, 2013
- Hitachi High-Technologies Corporation
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and its method
- Patent number 8,355,123
- Issue date Jan 15, 2013
- Hitachi High-Technologies Corporation
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection method and apparatus therefor
- Patent number 8,340,395
- Issue date Dec 25, 2012
- Hitachi High-Technologies Corporation
- Kaoru Sakai
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
RANGING SYSTEM, CALIBRATION METHOD, PROGRAM, AND ELECTRONIC APPARATUS
- Publication number 20220043113
- Publication date Feb 10, 2022
- Sony Semiconductor Solutions Corporation
- SHUNJI MAEDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MODULE AND DISTANCE-MEASURING DEVICE
- Publication number 20220003866
- Publication date Jan 6, 2022
- Sony Semiconductor Solutions Corporation
- SHUNJI MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE IMAGE SENSOR
- Publication number 20210409621
- Publication date Dec 30, 2021
- SONY GROUP CORPORATION
- Shunichi Sukegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL DISTANCE MEASUREMENT DEVICE AND OPTICAL DISTANCE MEASUREMEN...
- Publication number 20210396881
- Publication date Dec 23, 2021
- SONY SEMICONDUCTOR SOLUTIONS CORPORATION
- SHUNJI MAEDA
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASUREMENT APPARATUS AND DETECTION METHOD
- Publication number 20210356569
- Publication date Nov 18, 2021
- Sony Semiconductor Solutions Corporation
- SHUNJI MAEDA
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE IMAGE SENSOR, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE
- Publication number 20180109750
- Publication date Apr 19, 2018
- SONY CORPORATION
- Shunichi Sukegawa
- G01 - MEASURING TESTING
Information Patent Application
SOLID STATE IMAGE SENSOR, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE
- Publication number 20180109741
- Publication date Apr 19, 2018
- SONY CORPORATION
- Shunichi Sukegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR REVIEWING A DEFECT AND APPARATUS
- Publication number 20160018340
- Publication date Jan 21, 2016
- Hitachi High-Technologies Corporation
- Yuko Otani
- G01 - MEASURING TESTING
Information Patent Application
Anomaly Diagnosis Method and Apparatus
- Publication number 20150363925
- Publication date Dec 17, 2015
- Hitachi, Ltd
- Hisae SHIBUYA
- G01 - MEASURING TESTING
Information Patent Application
FACILITY STATUS MONITORING METHOD AND FACILITY STATUS MONITORING DE...
- Publication number 20150213706
- Publication date Jul 30, 2015
- Hitachi, Ltd
- Jie Bai
- G08 - SIGNALLING
Information Patent Application
HEALTH MANAGEMENT SYSTEM, FAULT DIAGNOSIS SYSTEM, HEALTH MANAGEMENT...
- Publication number 20150160098
- Publication date Jun 11, 2015
- Hitachi Power Solutions Co., Ltd.
- Toujirou NODA
- G01 - MEASURING TESTING
Information Patent Application
Facility State Monitoring Method and Device for Same
- Publication number 20140279795
- Publication date Sep 18, 2014
- Hitachi Power Solutions Co., Ltd.
- Hisae Shibuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Anomaly Detection/Diagnostic Method and Anomaly Detection/Diagnosti...
- Publication number 20140195184
- Publication date Jul 10, 2014
- Hitachi, Ltd
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MONITORING EQUIPMENT CONDITIONS
- Publication number 20140039834
- Publication date Feb 6, 2014
- Hitachi Power Solutions Co., Ltd.
- Hisae SHIBUYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND APPARATUS
- Publication number 20130343632
- Publication date Dec 26, 2013
- Hitachi High-Technologies Corporation
- Yuta URANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE
- Publication number 20130307963
- Publication date Nov 21, 2013
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE
- Publication number 20130294677
- Publication date Nov 7, 2013
- Takahiro Urano
- G01 - MEASURING TESTING
Information Patent Application
Anomaly Sensing and Diagnosis Method, Anomaly Sensing and Diagnosis...
- Publication number 20130282336
- Publication date Oct 24, 2013
- Hitachi, Ltd
- Shunji Maeda
- G05 - CONTROLLING REGULATING
Information Patent Application
DEFECT INSPECTION METHOD, DEFECT INSPECTION APPARATUS, PROGRAM PROD...
- Publication number 20130202188
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Takahiro URANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT CLASSIFICATION METHOD AND APPARATUS, AND DEFECT INSPECTION A...
- Publication number 20130202189
- Publication date Aug 8, 2013
- Hitachi High-Technologies Corporation
- Hisae Shibuya
- G01 - MEASURING TESTING
Information Patent Application
Malfunction Detection Method and System Thereof
- Publication number 20130173218
- Publication date Jul 4, 2013
- HITACHI, LTD.
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspecting Method and Inspecting Apparatus For Substrate Surface
- Publication number 20130107247
- Publication date May 2, 2013
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ANOMALY DETECTION/DIAGNOSIS, SYSTEM FOR ANOMALY DETECTIO...
- Publication number 20130073260
- Publication date Mar 21, 2013
- Shunji Maeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS OF INSPECTING DEFECT IN SEMICONDUCTOR AND METHOD OF THE SAME
- Publication number 20130038862
- Publication date Feb 14, 2013
- Akira Hamamatsu
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS
- Publication number 20130004057
- Publication date Jan 3, 2013
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR PATTERN INSPECTION
- Publication number 20130002849
- Publication date Jan 3, 2013
- Kaoru Sakai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANOMALY DETECTION METHOD AND ANOMALY DETECTION SYSTEM
- Publication number 20120316835
- Publication date Dec 13, 2012
- Shunji Maeda
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEVICE THEREOF
- Publication number 20120294507
- Publication date Nov 22, 2012
- Kaoru Sakai
- G01 - MEASURING TESTING
Information Patent Application
FAILURE DIAGNOSIS SYSTEM, FAILURE DIAGNOSIS DEVICE AND FAILURE DIAG...
- Publication number 20120290497
- Publication date Nov 15, 2012
- Hitachi, Ltd
- Hiroyuki Magara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR MONITORING THE STATE OF A FACILITY
- Publication number 20120290879
- Publication date Nov 15, 2012
- Hisae Shibuya
- G06 - COMPUTING CALCULATING COUNTING

Shunji Maeda

Person

Patents Grantslast 30 patents

Stacked substrate solid state image sensor

Solid state image sensor comprising stacked substrates, semiconduct...

Solid state image sensor, semiconductor device, and electronic device

Health management system, fault diagnosis system, health management...

Anomaly diagnosis method and apparatus

Method for reviewing a defect and apparatus

Facility state monitoring method and device for same

Anomaly detection and diagnosis/prognosis method, anomaly detection...

Method and apparatus for inspecting patterns formed on a substrate

Defect inspection method and device thereof

Defect inspection method and apparatus

Method for inspecting pattern defect and device for realizing the same

Dark-field defect inspecting method, dark-field defect inspecting a...

Method and device for monitoring the state of a facility

Defect classification method and apparatus, and defect inspection a...

Inspecting method and inspecting apparatus for substrate surface

Apparatus of inspecting defect in semiconductor and method of the same

Method and apparatus for inspecting pattern defects

Defect inspection device and defect inspection method

Error detection method and its system for early detection of errors...

Visual inspection method and apparatus and image analysis system

Fault inspection method

Method and equipment for detecting pattern defect

Method and apparatus for inspecting patterns formed on a substrate

Method and apparatus for detecting defects

Defect classification method and apparatus, and defect inspection a...

Defect inspection method and apparatus

Pattern defect inspection method and its apparatus

Defect inspection apparatus and its method

Defect inspection method and apparatus therefor

Patents Applicationslast 30 patents

RANGING SYSTEM, CALIBRATION METHOD, PROGRAM, AND ELECTRONIC APPARATUS

OPTICAL MODULE AND DISTANCE-MEASURING DEVICE

SOLID STATE IMAGE SENSOR

OPTICAL DISTANCE MEASUREMENT DEVICE AND OPTICAL DISTANCE MEASUREMEN...

DISTANCE MEASUREMENT APPARATUS AND DETECTION METHOD

SOLID STATE IMAGE SENSOR, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE

SOLID STATE IMAGE SENSOR, SEMICONDUCTOR DEVICE, AND ELECTRONIC DEVICE

METHOD FOR REVIEWING A DEFECT AND APPARATUS

Anomaly Diagnosis Method and Apparatus

FACILITY STATUS MONITORING METHOD AND FACILITY STATUS MONITORING DE...

HEALTH MANAGEMENT SYSTEM, FAULT DIAGNOSIS SYSTEM, HEALTH MANAGEMENT...

Facility State Monitoring Method and Device for Same

Anomaly Detection/Diagnostic Method and Anomaly Detection/Diagnosti...

METHOD AND APPARATUS FOR MONITORING EQUIPMENT CONDITIONS

DEFECT INSPECTION METHOD AND APPARATUS

METHOD AND APPARATUS FOR INSPECTING PATTERNS FORMED ON A SUBSTRATE

DEFECT INSPECTION METHOD AND DEFECT INSPECTION DEVICE

Anomaly Sensing and Diagnosis Method, Anomaly Sensing and Diagnosis...

DEFECT INSPECTION METHOD, DEFECT INSPECTION APPARATUS, PROGRAM PROD...

DEFECT CLASSIFICATION METHOD AND APPARATUS, AND DEFECT INSPECTION A...

Malfunction Detection Method and System Thereof

Inspecting Method and Inspecting Apparatus For Substrate Surface

METHOD FOR ANOMALY DETECTION/DIAGNOSIS, SYSTEM FOR ANOMALY DETECTIO...

APPARATUS OF INSPECTING DEFECT IN SEMICONDUCTOR AND METHOD OF THE SAME

METHOD AND APPARATUS FOR INSPECTING PATTERN DEFECTS

METHOD AND APPARATUS FOR PATTERN INSPECTION

ANOMALY DETECTION METHOD AND ANOMALY DETECTION SYSTEM

DEFECT INSPECTION METHOD AND DEVICE THEREOF

FAILURE DIAGNOSIS SYSTEM, FAILURE DIAGNOSIS DEVICE AND FAILURE DIAG...

METHOD AND DEVICE FOR MONITORING THE STATE OF A FACILITY