Shunpei Suzuki

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Chiba, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical measuring device and optical measuring method
- Patent number 9,766,174
- Issue date Sep 19, 2017
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Fine particle measurement apparatus and optical axis calibration me...
- Patent number 8,994,940
- Issue date Mar 31, 2015
- Sony Corporation
- Suguru Dowaki
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle measurement apparatus and microparticle analysis method
- Patent number 8,941,081
- Issue date Jan 27, 2015
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Optical measuring device and optical measuring method
- Patent number 8,780,338
- Issue date Jul 15, 2014
- Sony Corporation
- Shunpei Suzuki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MICROCHIP AND MICROCHIP-TYPE FINE-PARTICLE MEASURING DEVICE
- Publication number 20140370586
- Publication date Dec 18, 2014
- Katsuhiro Seo
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
- Publication number 20140293273
- Publication date Oct 2, 2014
- SONY CORPORATION
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Application
MICROPARTICLE MEASUREMENT APPARATUS AND MICROPARTICLE ANALYSIS METHOD
- Publication number 20140021370
- Publication date Jan 23, 2014
- Shunpei Suzuki
- G01 - MEASURING TESTING
Information Patent Application
FINE PARTICLE MEASUREMENT APPARATUS AND OPTICAL AXIS CALIBRATION ME...
- Publication number 20120050737
- Publication date Mar 1, 2012
- SONY CORPORATION
- Suguru Dowaki
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING DEVICE AND OPTICAL MEASURING METHOD
- Publication number 20110222050
- Publication date Sep 15, 2011
- SONY CORPORATION
- Shunpei Suzuki
- G01 - MEASURING TESTING