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Shunran DI
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Weifang City, Shandong Province, CN
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Patents Grants
last 30 patents
Information
Patent Grant
Method and device for optimizing object-class model based on neural...
Patent number
11,748,975
Issue date
Sep 5, 2023
GOERTEK INC.
Shunran Di
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Product defect detection method, device and system
Patent number
11,741,593
Issue date
Aug 29, 2023
GOERTEK INC.
Jie Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for extracting key frames in simultaneous localiz...
Patent number
11,466,988
Issue date
Oct 11, 2022
GoerTek Inc.
Baoming Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
PRODUCT DEFECT DETECTION METHOD, DEVICE AND SYSTEM
Publication number
20220309640
Publication date
Sep 29, 2022
GOERTEK INC.
Jie LIU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR OPTIMIZING OBJECT-CLASS MODEL BASED ON NEURAL...
Publication number
20220309765
Publication date
Sep 29, 2022
GOERTEK INC.
Shunran DI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR SMALL SAMPLE DEFECT CLASSIFICATION AND COMPUT...
Publication number
20220309764
Publication date
Sep 29, 2022
GOERTEK INC.
Jie LIU
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR EXTRACTING KEY FRAMES IN SIMULTANEOUS LOCALIZ...
Publication number
20210223046
Publication date
Jul 22, 2021
Goertek Inc.
Baoming LI
G01 - MEASURING TESTING