Shunroku Taya

Person

Mito, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Element mapping unit, scanning transmission electron microscope, an...
- Patent number 7,928,376
- Issue date Apr 19, 2011
- Hitachi, Ltd.
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator and scanning electron microscope using the same
- Patent number 7,838,827
- Issue date Nov 23, 2010
- Hitachi High-Technologies Corporation
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Monochromator and scanning electron microscope using the same
- Patent number 7,315,024
- Issue date Jan 1, 2008
- Hitachi High-Technologies Corporation
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,250,601
- Issue date Jul 31, 2007
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,067,805
- Issue date Jun 27, 2006
- Hitachi High-Technologies Corporation
- Kazutoshi Kajl
- G01 - MEASURING TESTING
Information Patent Grant
Monochromator and scanning electron microscope using the same
- Patent number 7,022,983
- Issue date Apr 4, 2006
- Hitachi High-Technologies Corporation
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,933,501
- Issue date Aug 23, 2005
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Ultimate analyzer, scanning transmission electron microscope and ul...
- Patent number 6,794,648
- Issue date Sep 21, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 6,703,613
- Issue date Mar 9, 2004
- Hitachi, Ltd.
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Projecting type charged particle microscope and projecting type sub...
- Patent number 6,310,341
- Issue date Oct 30, 2001
- Hitachi, Ltd.
- Hideo Todokoro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Energy filter and electron microscope equipped with the energy filter
- Patent number 6,150,657
- Issue date Nov 21, 2000
- Hitachi, Ltd.
- Koji Kimoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy filter
- Patent number 6,066,852
- Issue date May 23, 2000
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron energy filter and transmission electron microscope provide...
- Patent number 5,585,630
- Issue date Dec 17, 1996
- Hitachi, Ltd.
- Yoshifumi Taniguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic lens arrangement of multi-stages of multi-pole electr...
- Patent number 5,291,016
- Issue date Mar 1, 1994
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Post-acceleration detector for mass spectrometer
- Patent number 4,972,083
- Issue date Nov 20, 1990
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analyzer tube for mass spectrometry
- Patent number 4,947,041
- Issue date Aug 7, 1990
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electric multipole lens
- Patent number 4,870,283
- Issue date Sep 26, 1989
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation apparatus for semiconductor manufacture
- Patent number 4,839,523
- Issue date Jun 13, 1989
- Hitachi, Ltd.
- Shunroku Taya
- C30 - CRYSTAL GROWTH
Information Patent Grant
Microwave discharge type ion source for ion injection devices
- Patent number 4,703,180
- Issue date Oct 27, 1987
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implanter
- Patent number 4,634,931
- Issue date Jan 6, 1987
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Plasma ion source
- Patent number 4,629,930
- Issue date Dec 16, 1986
- Hitachi, Ltd.
- Noriyuki Sakudo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimens rotating device
- Patent number 4,599,516
- Issue date Jul 8, 1986
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion implantation apparatus
- Patent number 4,476,393
- Issue date Oct 9, 1984
- Hitachi, Ltd.
- Shunroku Taya
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Monochromator and scanning electron microscope using the same
- Publication number 20080237463
- Publication date Oct 2, 2008
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monochromator and scanning electron microscope using the same
- Publication number 20060219910
- Publication date Oct 5, 2006
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20060163479
- Publication date Jul 27, 2006
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Element mapping unit, scanning transmission electron microscope, an...
- Publication number 20060011836
- Publication date Jan 19, 2006
- Kazutoshi Kaji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Monochromator and scanning electron microscope using the same
- Publication number 20040188607
- Publication date Sep 30, 2004
- Yoichi Ose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20040183011
- Publication date Sep 23, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20040169143
- Publication date Sep 2, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085356
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Ultimate analyzer, scanning transmission electron microscope and ul...
- Publication number 20030085350
- Publication date May 8, 2003
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20020096632
- Publication date Jul 25, 2002
- Kazutoshi Kaji
- G01 - MEASURING TESTING

Shunroku Taya

Person

Patents Grantslast 30 patents

Element mapping unit, scanning transmission electron microscope, an...

Monochromator and scanning electron microscope using the same

Monochromator and scanning electron microscope using the same

Energy spectrum measuring apparatus, electron energy loss spectrome...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Monochromator and scanning electron microscope using the same

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Projecting type charged particle microscope and projecting type sub...

Energy filter and electron microscope equipped with the energy filter

Electron energy filter

Electron energy filter and transmission electron microscope provide...

Electrostatic lens arrangement of multi-stages of multi-pole electr...

Post-acceleration detector for mass spectrometer

Analyzer tube for mass spectrometry

Electric multipole lens

Ion implantation apparatus for semiconductor manufacture

Microwave discharge type ion source for ion injection devices

Ion implanter

Plasma ion source

Specimens rotating device

Ion implantation apparatus

Patents Applicationslast 30 patents

Monochromator and scanning electron microscope using the same

Monochromator and scanning electron microscope using the same

Energy spectrum measuring apparatus, electron energy loss spectrome...

Element mapping unit, scanning transmission electron microscope, an...

Monochromator and scanning electron microscope using the same

Energy spectrum measuring apparatus, electron energy loss spectrome...

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Ultimate analyzer, scanning transmission electron microscope and ul...

Energy spectrum measuring apparatus, electron energy loss spectrome...