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Shunsuke Ariyoshi
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Kobe-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sample measurement method and sample measurement device
Patent number
11,754,580
Issue date
Sep 12, 2023
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus
Patent number
RE49503
Issue date
Apr 25, 2023
Sysmex Corporation
Keisuke Kuwano
Information
Patent Grant
Sample processing apparatus
Patent number
RE48189
Issue date
Sep 1, 2020
Sysmex Corporation
Keisuke Kuwano
Information
Patent Grant
Specimen analysis system, specimen analyzer, and specimen analysis...
Patent number
9,618,363
Issue date
Apr 11, 2017
Sysmex Corporation
Tetsuya Oda
G05 - CONTROLLING REGULATING
Information
Patent Grant
Sample analyzer and sample analyzing method
Patent number
9,500,662
Issue date
Nov 22, 2016
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Data management computer, sample analyzing system, and computer pro...
Patent number
9,317,658
Issue date
Apr 19, 2016
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Method of managing clinical testing apparatus, clinical testing sys...
Patent number
9,280,642
Issue date
Mar 8, 2016
Sysmex Corporation
Yusuke Suga
G05 - CONTROLLING REGULATING
Information
Patent Grant
Sample processing apparatus and non-transitory storage medium
Patent number
9,074,971
Issue date
Jul 7, 2015
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, computer program product for a sample analyzer and...
Patent number
8,996,317
Issue date
Mar 31, 2015
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing system
Patent number
8,942,852
Issue date
Jan 27, 2015
Sysmex Corporation
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus
Patent number
8,706,303
Issue date
Apr 22, 2014
Sysmex Corporation
Keisuke Kuwano
G01 - MEASURING TESTING
Information
Patent Grant
Sample processing apparatus, method of outputting processing result...
Patent number
8,700,339
Issue date
Apr 15, 2014
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Sample analyzer, method for displaying analysis result information...
Patent number
8,504,301
Issue date
Aug 6, 2013
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Grant
Specimen testing apparatus, test information management apparatus,...
Patent number
8,209,196
Issue date
Jun 26, 2012
Sysmex Corporation
Shunsuke Ariyoshi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Sample processing apparatus, method of outputting processing result...
Patent number
8,180,573
Issue date
May 15, 2012
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SAMPLE MEASUREMENT METHOD AND SAMPLE MEASUREMENT DEVICE
Publication number
20190204349
Publication date
Jul 4, 2019
SYSMEX CORPORATION
Shunsuke ARIYOSHI
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER AND SAMPLE ANALYZING METHOD
Publication number
20150064795
Publication date
Mar 5, 2015
SYSMEX CORPORATION
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER
Publication number
20140119994
Publication date
May 1, 2014
SYSMEX CORPORATION
Shunsuke ARIYOSHI
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN ANALYSIS SYSTEM, SPECIMEN ANALYZER, AND SPECIMEN ANALYSIS...
Publication number
20130317773
Publication date
Nov 28, 2013
SYSMEX CORPORATION
Tetsuya ODA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANAGING CLINICAL TESTING APPARATUS, CLINICAL TESTING SYS...
Publication number
20120283980
Publication date
Nov 8, 2012
Yusuke Suga
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS
Publication number
20120282155
Publication date
Nov 8, 2012
Keisuke Kuwano
G01 - MEASURING TESTING
Information
Patent Application
DATA MANAGEMENT COMPUTER, SAMPLE ANALYZING SYSTEM, AND COMPUTER PRO...
Publication number
20120272755
Publication date
Nov 1, 2012
Shunsuke Ariyoshi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SAMPLE PROCESSING SYSTEM
Publication number
20120269681
Publication date
Oct 25, 2012
Hiroo Tatsutani
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS, METHOD OF OUTPUTTING PROCESSING RESULT...
Publication number
20120203468
Publication date
Aug 9, 2012
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE PROCESSING APPARATUS AND NON-TRANSITORY STORAGE MEDIUM
Publication number
20120109529
Publication date
May 3, 2012
SYSMEX CORPORATION
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
SAMPLE ANALYZER, COMPUTER PROGRAM PRODUCT FOR A SAMPLE ANALYZER AND...
Publication number
20110054847
Publication date
Mar 3, 2011
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
SPECIMEN TESTING APPARATUS, TEST INFORMATION MANAGEMENT APPARATUS,...
Publication number
20110035237
Publication date
Feb 10, 2011
Shunsuke Ariyoshi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sample analyzer, method for displaying analysis result information...
Publication number
20100010746
Publication date
Jan 14, 2010
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
Sample analyzer, particle distribution diagram displaying method an...
Publication number
20090323062
Publication date
Dec 31, 2009
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
Sample processing apparatus, method of outputting processing result...
Publication number
20090187348
Publication date
Jul 23, 2009
Sysmex Corporation
Shunsuke Ariyoshi
G01 - MEASURING TESTING
Information
Patent Application
Analyzer, information processing device and computer program product
Publication number
20070179715
Publication date
Aug 2, 2007
Sysmex Corporation
Shunsuke Ariyoshi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Sample analyzer, processing computer for sample analysis, method of...
Publication number
20070078631
Publication date
Apr 5, 2007
Sysmex Corporation
Shunsuke Ariyoshi
G06 - COMPUTING CALCULATING COUNTING