Shunsuke Kurata

Person

Kamlina-gun, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspecting apparatus and inspecting method
- Patent number 7,456,947
- Issue date Nov 25, 2008
- Olympus Corporation
- Shunsuke Kurata
- G01 - MEASURING TESTING
Information Patent Grant
Substrate processing apparatus and substrate processing system
- Patent number 7,369,237
- Issue date May 6, 2008
- Olympus Corporation
- Yasunori Ikeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image inspection system for correcting focal position in autofocusing
- Patent number 7,365,295
- Issue date Apr 29, 2008
- Olympus Corporation
- Shunsuke Kurata
- G02 - OPTICS
Information Patent Grant
Method and apparatus for inspecting semiconductor wafer
- Patent number 7,308,329
- Issue date Dec 11, 2007
- Olympus Corporation
- Yasunori Ikeno
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Semiconductor wafer inspection apparatus
- Patent number 7,102,743
- Issue date Sep 5, 2006
- Olympus Corporation
- Haruyuki Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus
- Patent number 7,084,383
- Issue date Aug 1, 2006
- Olympus Corporation
- Kazuhito Horiuchi
- G02 - OPTICS
Information Patent Grant
Alignment apparatus for object on stage
- Patent number 7,053,393
- Issue date May 30, 2006
- Olympus Corporation
- Yoshihisa Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Small sized imaging device which detects position information and i...
- Patent number 6,710,320
- Issue date Mar 23, 2004
- Olympus Optical Co., Ltd.
- Shunsuke Kurata
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for aligning target object
- Patent number 6,549,290
- Issue date Apr 15, 2003
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G01 - MEASURING TESTING
Information Patent Grant
Alignment apparatus
- Patent number 6,549,825
- Issue date Apr 15, 2003
- Olympus Optical Co., Ltd.
- Shunsuke Kurata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Visual inspection apparatus
- Publication number 20080239301
- Publication date Oct 2, 2008
- OLYMPUS CORPORATION
- Atsutoshi Yokota
- G01 - MEASURING TESTING
Information Patent Application
Observation apparatus with focal position control mechanism
- Publication number 20070164194
- Publication date Jul 19, 2007
- OLYMPUS CORPORATION
- Shunsuke Kurata
- G02 - OPTICS
Information Patent Application
Image inspection system for correcting focal position in autofocusing
- Publication number 20060249651
- Publication date Nov 9, 2006
- OLYMPUS CORPORATION
- Shunsuke Kurata
- G02 - OPTICS
Information Patent Application
Method and apparatus for inspecting semiconductor wafer
- Publication number 20060161284
- Publication date Jul 20, 2006
- OLYMPUS CORPORATION
- Yasunori Ikeno
- G05 - CONTROLLING REGULATING
Information Patent Application
Substrate processing apparatus and substrate processing system
- Publication number 20060008134
- Publication date Jan 12, 2006
- OLYMPUS CORPORATION
- Yasunori Ikeno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Inspecting apparatus and inspecting method
- Publication number 20050206885
- Publication date Sep 22, 2005
- OLYMPUS CORPORATION
- Shunsuke Kurata
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection apparatus
- Publication number 20050062960
- Publication date Mar 24, 2005
- Olympus Optical Co., Ltd.
- Haruyuki Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Image processing apparatus
- Publication number 20040046102
- Publication date Mar 11, 2004
- Olympus Optical Co.,Ltd.
- Kazuhito Horiuchi
- G02 - OPTICS
Information Patent Application
Alignment apparatus
- Publication number 20030222229
- Publication date Dec 4, 2003
- Olympus Optical Co., Ltd.
- Yoshihisa Taniguchi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor wafer inspection apparatus
- Publication number 20030202178
- Publication date Oct 30, 2003
- Olympus Optical Co., Ltd.
- Haruyuki Tsuji
- G01 - MEASURING TESTING
Information Patent Application
Optical sensor
- Publication number 20020153473
- Publication date Oct 24, 2002
- Olympus Optical Co., Ltd.
- Shunsuke Kurata
- G01 - MEASURING TESTING
Information Patent Application
Alignment apparatus
- Publication number 20020131848
- Publication date Sep 19, 2002
- Olympus Optical Co., Ltd.
- Shunsuke Kurata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for aligning target object
- Publication number 20010006571
- Publication date Jul 5, 2001
- Olympus Optical Co., Ltd.
- Yasutada Miura
- G01 - MEASURING TESTING

Shunsuke Kurata

Person

Patents Grantslast 30 patents

Inspecting apparatus and inspecting method

Substrate processing apparatus and substrate processing system

Image inspection system for correcting focal position in autofocusing

Method and apparatus for inspecting semiconductor wafer

Semiconductor wafer inspection apparatus

Image processing apparatus

Alignment apparatus for object on stage

Small sized imaging device which detects position information and i...

Method and apparatus for aligning target object

Alignment apparatus

Patents Applicationslast 30 patents

Visual inspection apparatus

Observation apparatus with focal position control mechanism

Image inspection system for correcting focal position in autofocusing

Method and apparatus for inspecting semiconductor wafer

Substrate processing apparatus and substrate processing system

Inspecting apparatus and inspecting method

Semiconductor wafer inspection apparatus

Image processing apparatus

Alignment apparatus

Semiconductor wafer inspection apparatus

Optical sensor

Alignment apparatus

Method and apparatus for aligning target object