Shunsuke MATSUDA

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Confocal microscope unit and confocal microscope
- Patent number 12,117,600
- Issue date Oct 15, 2024
- Hamamatsu Photonics K.K.
- Jiro Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Confocal microscope unit and confocal microscope
- Patent number 12,078,789
- Issue date Sep 3, 2024
- Hamamatsu Photonics K.K.
- Jiro Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Observation device and observation method
- Patent number 11,513,075
- Issue date Nov 29, 2022
- Hamamatsu Photonics K.K.
- Akira Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method
- Patent number 10,607,900
- Issue date Mar 31, 2020
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Inspection system and inspection method
- Patent number 10,312,166
- Issue date Jun 4, 2019
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...
- Publication number 20240231067
- Publication date Jul 11, 2024
- Hamamatsu Photonics K.K.
- Takashi MIHOYA
- G02 - OPTICS
Information Patent Application
SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...
- Publication number 20240134177
- Publication date Apr 25, 2024
- Hamamatsu Photonics K.K.
- Takashi MIHOYA
- G02 - OPTICS
Information Patent Application
CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE
- Publication number 20220179185
- Publication date Jun 9, 2022
- Hamamatsu Photonics K.K.
- Jiro YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE
- Publication number 20220155577
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Jiro YAMASHITA
- G02 - OPTICS
Information Patent Application
SCANNING MICROSCOPE UNIT
- Publication number 20220155576
- Publication date May 19, 2022
- Hamamatsu Photonics K.K.
- Jiro YAMASHITA
- G02 - OPTICS
Information Patent Application
OBSERVATION DEVICE AND OBSERVATION METHOD
- Publication number 20190376893
- Publication date Dec 12, 2019
- Hamamatsu Photonics K.K.
- Akira TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20190221486
- Publication date Jul 18, 2019
- HAMAMATSU PHOTONICS K. K.
- Shinsuke SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
OPTICAL UNIT AND METHOD FOR ADJUSTING OPTICAL UNIT
- Publication number 20190137750
- Publication date May 9, 2019
- Hamamatsu Photonics K.K.
- Hirotoshi TERADA
- G02 - OPTICS
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20180033704
- Publication date Feb 1, 2018
- Hamamatsu Photonics K.K.
- Shinsuke SUZUKI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Shunsuke MATSUDA

Person

Patents Grantslast 30 patents

Confocal microscope unit and confocal microscope

Confocal microscope unit and confocal microscope

Observation device and observation method

Inspection system and inspection method

Inspection system and inspection method

Patents Applicationslast 30 patents

SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...

SCANNING MICROSCOPE UNIT, SCANNING MICROSCOPE, AND CALIBRATION METH...

CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE

CONFOCAL MICROSCOPE UNIT AND CONFOCAL MICROSCOPE

SCANNING MICROSCOPE UNIT

OBSERVATION DEVICE AND OBSERVATION METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

OPTICAL UNIT AND METHOD FOR ADJUSTING OPTICAL UNIT

INSPECTION SYSTEM AND INSPECTION METHOD