Shunsuke MIZUTANI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam device and charged particle beam device calib...
- Patent number 11,848,171
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scintillator for charged particle beam apparatus and charged partic...
- Patent number 11,846,736
- Issue date Dec 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Eri Takahashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measurement device and signal processing method
- Patent number 11,842,881
- Issue date Dec 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,749,497
- Issue date Sep 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,694,873
- Issue date Jul 4, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,515,120
- Issue date Nov 29, 2022
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi Sekiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam control device
- Patent number 11,211,225
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,139,144
- Issue date Oct 5, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,991,543
- Issue date Apr 27, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke Mizutani
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle detector and charged particle beam apparatus
- Patent number 10,984,979
- Issue date Apr 20, 2021
- HITACHI HIGH-TECH CORPORATION
- Shin Imamura
- G01 - MEASURING TESTING
Information Patent Grant
Pattern measuring method, pattern measuring tool and computer reada...
- Patent number 10,903,041
- Issue date Jan 26, 2021
- HITACHI HIGH-TECH CORPORATION
- Uki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle beam system
- Patent number 10,872,745
- Issue date Dec 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM
- Publication number 20230335373
- Publication date Oct 19, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20230317399
- Publication date Oct 5, 2023
- HITACHI HIGH-TECH CORPORATION
- Toshimasa KAMEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20230290606
- Publication date Sep 14, 2023
- Hitachi High-Tech Corporation
- Yusuke ABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20230030651
- Publication date Feb 2, 2023
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...
- Publication number 20220246392
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...
- Publication number 20220244412
- Publication date Aug 4, 2022
- HITACHI HIGH-TECH CORPORATION
- Eri TAKAHASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220230845
- Publication date Jul 21, 2022
- HITACHI HIGH-TECH CORPORATION
- Kohei SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20220068597
- Publication date Mar 3, 2022
- Hitachi High-Tech Corporation
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measurement Method, Measurement System, and Computer-Readab...
- Publication number 20210404801
- Publication date Dec 30, 2021
- Ayumi DOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20210375583
- Publication date Dec 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210183614
- Publication date Jun 17, 2021
- HITACHI HIGH-TECH CORPORATION
- Yoshifumi SEKIGUCHI
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM CONTROL DEVICE
- Publication number 20210066033
- Publication date Mar 4, 2021
- HITACHI HIGH-TECH CORPORATION
- Shinichi Murakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20200035450
- Publication date Jan 30, 2020
- Hitachi High-Technologies Corporation
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20200020504
- Publication date Jan 16, 2020
- Hitachi High-Technologies Corporation
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pattern Measuring Method, Pattern Measuring Tool and Computer Reada...
- Publication number 20190378679
- Publication date Dec 12, 2019
- Hitachi High-Technologies Corporation
- Uki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20190355552
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Shunsuke MIZUTANI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190355549
- Publication date Nov 21, 2019
- Hitachi High-Technologies Corporation
- Shin IMAMURA
- H01 - BASIC ELECTRIC ELEMENTS

Shunsuke MIZUTANI

Person

Patents Grantslast 30 patents

Charged particle beam device and charged particle beam device calib...

Scintillator for charged particle beam apparatus and charged partic...

Measurement device and signal processing method

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus

Charged particle beam control device

Charged particle beam apparatus

Charged particle beam device

Charged particle detector and charged particle beam apparatus

Pattern measuring method, pattern measuring tool and computer reada...

Charged-particle beam system

Patents Applicationslast 30 patents

CHARGED PARTICLE BEAM APPARATUS AND PROCESSOR SYSTEM

Charged Particle Beam Device

Charged Particle Beam Device

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM DEVICE AND CHARGED PARTICLE BEAM DEVICE CALIB...

SCINTILLATOR FOR CHARGED PARTICLE BEAM APPARATUS AND CHARGED PARTIC...

Charged Particle Beam Device

MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD

Pattern Measurement Method, Measurement System, and Computer-Readab...

Charged Particle Beam Apparatus

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM CONTROL DEVICE

Charged Particle Beam Device

CHARGED-PARTICLE BEAM SYSTEM

Pattern Measuring Method, Pattern Measuring Tool and Computer Reada...

Charged Particle Beam Apparatus

CHARGED PARTICLE DETECTOR AND CHARGED PARTICLE BEAM APPARATUS