Shunsuke NOGUCHI

Person

Hikone-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
SiC wafer and SiC epitaxial wafer
- Patent number 12,227,875
- Issue date Feb 18, 2025
- Resonac Corporation
- Shunsuke Noguchi
- C30 - CRYSTAL GROWTH
Information Patent Grant
SiC single crystal, method of manufacturing SiC ingot, and method o...
- Patent number 11,905,621
- Issue date Feb 20, 2024
- Resonac Corporation
- Shunsuke Noguchi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of acquiring sample for evaluation of SiC single crystal
- Patent number 11,815,437
- Issue date Nov 14, 2023
- Resonac Corporation
- Shunsuke Noguchi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Pedestal for supporting a seed for SiC single crystal growth which...
- Patent number 11,519,096
- Issue date Dec 6, 2022
- Showa Denko K.K.
- Shunsuke Noguchi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Crystal growth apparatus
- Patent number 11,447,890
- Issue date Sep 20, 2022
- Showa Denko K.K.
- Shunsuke Noguchi
- C30 - CRYSTAL GROWTH
Information Patent Grant
Method of manufacturing tantalum carbide material
- Patent number 11,027,977
- Issue date Jun 8, 2021
- Showa Denko K.K.
- Shunsuke Noguchi
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
SiC substrate evaluation method, SiC epitaxial wafer manufacturing...
- Patent number 10,978,359
- Issue date Apr 13, 2021
- Showa Denko K.K.
- Shunsuke Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for evaluating tantalum carbide
- Patent number 10,900,888
- Issue date Jan 26, 2021
- Showa Denko K.K.
- Shunsuke Noguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SiC INGOT AND METHOD FOR MANUFACTURING SiC SUBSTRATE
- Publication number 20250215611
- Publication date Jul 3, 2025
- Resonac Corporation
- Shunsuke NOGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC WAFER AND SiC EPITAXIAL WAFER
- Publication number 20250154684
- Publication date May 15, 2025
- Resonac Corporation
- Shunsuke NOGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC WAFER AND SiC EPITAXIAL WAFER
- Publication number 20240200227
- Publication date Jun 20, 2024
- Resonac Corporation
- Shunsuke NOGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC SINGLE CRYSTAL, METHOD OF MANUFACTURING SiC INGOT, AND METHOD O...
- Publication number 20210246572
- Publication date Aug 12, 2021
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC SINGLE CRYSTAL, METHOD OF MANUFACTURING SiC INGOT, AND METHOD O...
- Publication number 20210189596
- Publication date Jun 24, 2021
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD OF MANUFACTURING TANTALUM CARBIDE MATERIAL
- Publication number 20200198980
- Publication date Jun 25, 2020
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- C01 - INORGANIC CHEMISTRY
Information Patent Application
METHOD OF ACQUIRING SAMPLE FOR EVALUATION OF SiC SINGLE CRYSTAL
- Publication number 20200182752
- Publication date Jun 11, 2020
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- G01 - MEASURING TESTING
Information Patent Application
CRYSTAL GROWTH APPARATUS
- Publication number 20200080232
- Publication date Mar 12, 2020
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- C30 - CRYSTAL GROWTH
Information Patent Application
SiC SUBSTRATE EVALUATION METHOD, SiC EPITAXIAL WAFER MANUFACTURING...
- Publication number 20200083123
- Publication date Mar 12, 2020
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PEDESTAL, SiC SINGLE CRYSTAL MANUFACTURING APPARATUS, AND SiC SINGL...
- Publication number 20200024769
- Publication date Jan 23, 2020
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
SiC-MONOCRYSTAL GROWTH CRUCIBLE
- Publication number 20200017990
- Publication date Jan 16, 2020
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR EVALUATING TANTALUM CARBIDE
- Publication number 20190250096
- Publication date Aug 15, 2019
- SHOWA DENKO K.K.
- Shunsuke NOGUCHI
- G01 - MEASURING TESTING

Shunsuke NOGUCHI

Person

Patents Grantslast 30 patents

SiC wafer and SiC epitaxial wafer

SiC single crystal, method of manufacturing SiC ingot, and method o...

Method of acquiring sample for evaluation of SiC single crystal

Pedestal for supporting a seed for SiC single crystal growth which...

Crystal growth apparatus

Method of manufacturing tantalum carbide material

SiC substrate evaluation method, SiC epitaxial wafer manufacturing...

Method for evaluating tantalum carbide

Patents Applicationslast 30 patents

SiC INGOT AND METHOD FOR MANUFACTURING SiC SUBSTRATE

SiC WAFER AND SiC EPITAXIAL WAFER

SiC WAFER AND SiC EPITAXIAL WAFER

SiC SINGLE CRYSTAL, METHOD OF MANUFACTURING SiC INGOT, AND METHOD O...

SiC SINGLE CRYSTAL, METHOD OF MANUFACTURING SiC INGOT, AND METHOD O...

METHOD OF MANUFACTURING TANTALUM CARBIDE MATERIAL

METHOD OF ACQUIRING SAMPLE FOR EVALUATION OF SiC SINGLE CRYSTAL

CRYSTAL GROWTH APPARATUS

SiC SUBSTRATE EVALUATION METHOD, SiC EPITAXIAL WAFER MANUFACTURING...

PEDESTAL, SiC SINGLE CRYSTAL MANUFACTURING APPARATUS, AND SiC SINGL...

SiC-MONOCRYSTAL GROWTH CRUCIBLE

METHOD FOR EVALUATING TANTALUM CARBIDE