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Shunsuke SAITO

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  • Information Patent Application

    SAMPLE MEASURING APPARATUS AND SAMPLE MEASURING METHOD
    • Publication number 20190265264
    • Publication date Aug 29, 2019
    • SYSMEX CORPORATION
    • Takashi YAMATO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER
    • Publication number 20180267069
    • Publication date Sep 20, 2018
    • SYSMEX CORPORATION
    • Hironori KATSUMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SAMPLE ANALYZER
    • Publication number 20180259545
    • Publication date Sep 13, 2018
    • SYSMEX CORPORATION
    • Hironori KATSUMI
    • G01 - MEASURING TESTING