Shunya Watanabe

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 10,020,163
- Issue date Jul 10, 2018
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display screen with graphical user interface
- Patent number D774045
- Issue date Dec 13, 2016
- HITACHI HIGH-TECHNOLOGIES CORPROATION
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Display screen with graphical user interface
- Patent number D774046
- Issue date Dec 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- D14 - Recording, communication, or information retrieval equipment
Information Patent Grant
Charged particle beam apparatus, specimen observation system and op...
- Patent number 9,443,694
- Issue date Sep 13, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion milling device and ion milling processing method
- Patent number 9,355,817
- Issue date May 31, 2016
- Hitachi High-Technologies Corporation
- Shunya Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Observation specimen for use in electron microscopy, electron micro...
- Patent number 9,202,668
- Issue date Dec 1, 2015
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,058,957
- Issue date Jun 16, 2015
- Hitachi High-Technologies Corporation
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,964,845
- Issue date Jun 21, 2011
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device with DF-STEM image valuation method
- Patent number 7,459,683
- Issue date Dec 2, 2008
- Hitachi High-Technologies Corporation
- Mine Araki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 7,456,403
- Issue date Nov 25, 2008
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 6,963,069
- Issue date Nov 8, 2005
- Hitachi High-Technologies Corporation
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MOTOR AND METHOD OF MANUFACTURING STATOR
- Publication number 20220360152
- Publication date Nov 10, 2022
- SINFONIA TECHNOLOGY CO., LTD.
- Shunya Watanabe
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20160343542
- Publication date Nov 24, 2016
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...
- Publication number 20150076348
- Publication date Mar 19, 2015
- Hitachi High-Technologies Corporation
- Yayoi Konishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...
- Publication number 20140264018
- Publication date Sep 18, 2014
- Hitachi High-Technologies Corporation
- Takafumi Miwa
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20140131590
- Publication date May 15, 2014
- Kunji Shigeto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION MILLING DEVICE AND ION MILLING PROCESSING METHOD
- Publication number 20130240353
- Publication date Sep 19, 2013
- Hitachi High-Technologies Corporation
- Shunya Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20090050803
- Publication date Feb 26, 2009
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20070235645
- Publication date Oct 11, 2007
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device with DF-STEM image valuation method
- Publication number 20070085007
- Publication date Apr 19, 2007
- Hitachi High-Technologies Corporation
- Mine Araki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged particle beam device
- Publication number 20040238752
- Publication date Dec 2, 2004
- Yuusuke Tanba
- H01 - BASIC ELECTRIC ELEMENTS

Shunya Watanabe

Person

Patents Grantslast 30 patents

Charged particle beam apparatus, specimen observation system and op...

Display screen with graphical user interface

Display screen with graphical user interface

Charged particle beam apparatus, specimen observation system and op...

Ion milling device and ion milling processing method

Observation specimen for use in electron microscopy, electron micro...

Charged particle beam apparatus

Charged particle beam device

Charged particle beam device with DF-STEM image valuation method

Charged particle beam device

Charged particle beam device

Patents Applicationslast 30 patents

MOTOR AND METHOD OF MANUFACTURING STATOR

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

CHARGED PARTICLE BEAM APPARATUS, SPECIMEN OBSERVATION SYSTEM AND OP...

OBSERVATION SPECIMEN FOR USE IN ELECTRON MICROSCOPY, ELECTRON MICRO...

CHARGED PARTICLE BEAM APPARATUS

ION MILLING DEVICE AND ION MILLING PROCESSING METHOD

Charged particle beam device

Charged particle beam device

Charged particle beam device with DF-STEM image valuation method

Charged particle beam device