Shunzi Maeda

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Yokohama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 8,451,439
- Issue date May 28, 2013
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 8,149,395
- Issue date Apr 3, 2012
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 7,911,601
- Issue date Mar 22, 2011
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 7,446,866
- Issue date Nov 4, 2008
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 7,081,953
- Issue date Jul 25, 2006
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting pattern
- Patent number 6,831,737
- Issue date Dec 14, 2004
- Hitachi, Ltd.
- Sachio Uto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR INSPECTING PATTERN
- Publication number 20120176602
- Publication date Jul 12, 2012
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING PATTERN
- Publication number 20110170092
- Publication date Jul 14, 2011
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus And Method For Inspecting Pattern
- Publication number 20090066943
- Publication date Mar 12, 2009
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting pattern
- Publication number 20060256328
- Publication date Nov 16, 2006
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting pattern
- Publication number 20050062961
- Publication date Mar 24, 2005
- Sachio Uto
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for inspecting pattern
- Publication number 20030020904
- Publication date Jan 30, 2003
- Sachio Uto
- G01 - MEASURING TESTING