Shuqing Duan

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Shanghai, CN

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Patents Grantslast 30 patents

Information Patent Grant
Method for locating open circuit failure point of test structure
- Patent number 11,852,674
- Issue date Dec 26, 2023
- Shanghai Huali Microelectronics Corporation
- Cheng Wu
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
NANOSCALE FAILURE ANALYSIS METHOD
- Publication number 20250087453
- Publication date Mar 13, 2025
- Shanghai Huali Microeloctronics Corporation
- Yunong Sun
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for Locating Open Circuit Failure Point of Test Structure
- Publication number 20230160951
- Publication date May 25, 2023
- SHANGHAI HUALI MICROELECTRONICS CORPORATION
- Cheng Wu
- G01 - MEASURING TESTING