Shusuke Kantake

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Receiving apparatus, test apparatus, receiving method, and test method
- Patent number 8,604,773
- Issue date Dec 10, 2013
- Advantest Corporation
- Shusuke Kantake
- G11 - INFORMATION STORAGE
Information Patent Grant
Pulse width adjustment circuit, pulse width adjustment method, and...
- Patent number 7,574,316
- Issue date Aug 11, 2009
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Testing apparatus and testing method
- Patent number 7,549,099
- Issue date Jun 16, 2009
- Advantest Corporation
- Shusuke Kantake
- G01 - MEASURING TESTING
Information Patent Grant
Delay circuit, and testing apparatus
- Patent number 7,511,547
- Issue date Mar 31, 2009
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING
Information Patent Grant
Pulse width adjustment circuit, pulse width adjustment method, and...
- Patent number 7,460,969
- Issue date Dec 2, 2008
- Advantest Corporation
- Masakatsu Suda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110248733
- Publication date Oct 13, 2011
- Advantest Corporation
- Shusuke KANTAKE
- G01 - MEASURING TESTING
Information Patent Application
RECEIVING APPARATUS, TEST APPARATUS, RECEIVING METHOD, AND TEST METHOD
- Publication number 20110115468
- Publication date May 19, 2011
- Advantest Corporation
- Shusuke KANTAKE
- G01 - MEASURING TESTING
Information Patent Application
PULSE WIDTH ADJUSTMENT CIRCUIT, PULSE WIDTH ADJUSTMENT METHOD, AND...
- Publication number 20080201099
- Publication date Aug 21, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Pulse width adjustment circuit, pulse width adjustment method, and...
- Publication number 20080018371
- Publication date Jan 24, 2008
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Testing apparatus and testing method
- Publication number 20070006031
- Publication date Jan 4, 2007
- Advantest Corporation
- Shusuke Kantake
- G01 - MEASURING TESTING
Information Patent Application
Delay circuit, and testing apparatus
- Publication number 20060267656
- Publication date Nov 30, 2006
- Advantest Corporation
- Masakatsu Suda
- H03 - BASIC ELECTRONIC CIRCUITRY