Shuuji Kamimoto

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Hitachi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Stress evaluation method and apparatus therefor
- Patent number 6,240,784
- Issue date Jun 5, 2001
- Hitachi, Ltd.
- Masahiro Koike
- G01 - MEASURING TESTING
Information Patent Grant
Stress evaluation method and apparatus therefor
- Patent number 5,557,048
- Issue date Sep 17, 1996
- Hitachi, Ltd.
- Masahiro Koike
- G01 - MEASURING TESTING